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Advanced Preparation of Hard Materials for Cross-Sectional Tem Analysis

Published online by Cambridge University Press:  21 February 2011

Kim Ostreicher
Affiliation:
Materials Characterization Department, GTE Laboratories Incorporated, 40 Sylvan Road, Waltham, MA 02254
Changmo Sung
Affiliation:
Materials Characterization Department, GTE Laboratories Incorporated, 40 Sylvan Road, Waltham, MA 02254
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Abstract

The preparation of cross-sectional specimens for materials such as tungsten carbide containing ceramic coatings presents some unique problems. Pieces joined by the use of epoxies often separate at this interface during subsequent preparation steps as a result of the vibration and physical strain placed on the sample during the initial mechanical grinding and subsequent thinning process. These problems have been overcome through the use of a preparation process which essentially encapsulates the sample within the confines of an epoxy filled quartz tube. This preparation process has allowed for the cross-sectional analysis of Al2O3/TiC coatings on WC substrates and has revealed two distinct grain morphologies within the TiC coating.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

[1] Vuorinen, S. and Skogsmo, J., Surface Modification Tech., Sudarshan, T.S. and Bhat, D.G. ed., The Met. Soc., 1988, p143.Google Scholar
[2] Newcomb, S.B., J. Microscopy 140, 195 (1985).Google Scholar
[3] Libera, M., in A Technique For The Preparation Of Thin-Film Cross-Sections For Transmission Electron Microscopy, (MRS Symposium Proceedings, Vol.199, 1990), pp 243251.Google Scholar
[4] Daychak, J., in Making Durable Specimens For Electron Microscopy, NASA Tech Briefs, 13(6) 5556 (1989).Google Scholar