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Solid State NMR Measurements for Preliminary Lifetime Assessments in λ-Irradiated and Thermally Aged Siloxane Elastomers

Published online by Cambridge University Press:  01 February 2011

Sarah C. Chinn
Affiliation:
Chemistry and Materials Science Directorate, Lawrence Livermore National Laboratory, Livermore, CA 94550U.S.A.
Julie L. Herberg
Affiliation:
Chemistry and Materials Science Directorate, Lawrence Livermore National Laboratory, Livermore, CA 94550U.S.A.
April M. Sawvel
Affiliation:
Energy and Environment Directorate, Lawrence Livermore National Laboratory, Livermore, CA 94550, U.S.A.
Robert S. Maxwell
Affiliation:
Chemistry and Materials Science Directorate, Lawrence Livermore National Laboratory, Livermore, CA 94550U.S.A.
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Abstract

Siloxanes have a wide variety of applications throughout the aerospace industry which take advantage of their exceptional insulating and adhesive properties and general resilience. They also offer a wide range of tailorable engineering properties with changes in composition and filler content. They are, however, subject to degradation in radiatively and thermally harsh environments. We are using solid state nuclear magnetic resonance techniques to investigate changes in network and interfacial structure in siloxane elastomers and their correlations to changes in engineering performance in a series of degraded materials. Nuclear magnetic resonance (NMR) parameters such as transverse (T2) relaxation times, cross relaxation rates, and residual dipolar coupling constants provide excellent probes of changes crosslink density and motional dynamics of the polymers caused by multi-mechanism degradation. The results of NMR studies on aged siloxanes are being used in conjunction with other mechanical tests to provide insight into component failure and degradation kinetics necessary for preliminary lifetime assessments of these materials as well as into the structure-property relationships of the polymers. NMR and magnetic resonance imaging (MRI) results obtained both from high resolution NMR spectrometers as well as low resolution benchtop NMR screening tools will be presented.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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