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Diamond In-Line Monitors for Synchrotron Experiments

Published online by Cambridge University Press:  10 February 2011

P. Bergonzo ,
D. Tromson ,
A. Brambilla ,
C. Mer ,
B. Guizard  and
F. Foulon
P. Bergonzo
Affiliation:
LETI (CEA - Technologies Avancées)/DEIN/SPE, CEA/Saclay, F-91191 Gif-sur-Yvette, pbergonzo@cea.fr
D. Tromson
Affiliation:
LETI (CEA - Technologies Avancées)/DEIN/SPE, CEA/Saclay, F-91191 Gif-sur-Yvette, pbergonzo@cea.fr
A. Brambilla
Affiliation:
LETI (CEA - Technologies Avancées)/DEIN/SPE, CEA/Saclay, F-91191 Gif-sur-Yvette, pbergonzo@cea.fr
C. Mer
Affiliation:
LETI (CEA - Technologies Avancées)/DEIN/SPE, CEA/Saclay, F-91191 Gif-sur-Yvette, pbergonzo@cea.fr
B. Guizard
Affiliation:
LETI (CEA - Technologies Avancées)/DEIN/SPE, CEA/Saclay, F-91191 Gif-sur-Yvette, pbergonzo@cea.fr
F. Foulon
Affiliation:
LETI (CEA - Technologies Avancées)/DEIN/SPE, CEA/Saclay, F-91191 Gif-sur-Yvette, pbergonzo@cea.fr
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Abstract

Diamond polycrystalline films have been synthesised using the Chemical Vapour Deposition (CVD) technique in order to fabricate new types of photo-detectors for the characterisation of x-ray light sources as encountered in synchrotron experiments. Since diamond exhibits a low absorption to low energy x-ray photons, these devices allow beam position monitoring with very little beam attenuation at photon energies as low as 2 keV. We present here diamond based new devices for four different applications, including (i) semitransparent beam intensity and (ii) position monitors with high position resolution (< 2 µm), (iii) beam profile monitors with 20 µm pitch resolution, and (iv) ultra-fast diamond detectors (response time < 100 ps) that enable the intensity and temporal monitoring of fast x-ray pulses. These devices can be used for in-line characterisation of synchrotron beam line experiments for permanent in-situ monitoring of beam instabilities during experiments as well as for synchrotron machine diagnostics.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 125
Copyright
Copyright © Materials Research Society 2000

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References

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