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Field Emission Energy Distribution and Current-Voltage Characteristics Using Single Tip Gated Diodes

Published online by Cambridge University Press:  10 February 2011

John M Bernhard ,
Ambrosio A. Rouse ,
Edward D. Sosa ,
Bruce E. Gnade ,
David E. Golden ,
Babu R. Chalamala ,
Sanjeev Aggarwal  and
R. Ramesh
John M Bernhard
Affiliation:
University of North Texas, Physics & Material Science Departments, Denton, TX 76203
Ambrosio A. Rouse
Affiliation:
University of North Texas, Physics & Material Science Departments, Denton, TX 76203
Edward D. Sosa
Affiliation:
University of North Texas, Physics & Material Science Departments, Denton, TX 76203
Bruce E. Gnade
Affiliation:
University of North Texas, Physics & Material Science Departments, Denton, TX 76203
David E. Golden
Affiliation:
University of North Texas, Physics & Material Science Departments, Denton, TX 76203
Babu R. Chalamala
Affiliation:
Motorola, Inc., Flat Panel Display Division, Tempe, AZ 85284
Sanjeev Aggarwal
Affiliation:
University of Maryland, Dept. of Material Science and Nuclear Eng., College Park, MD 20742
R. Ramesh
Affiliation:
University of Maryland, Dept. of Material Science and Nuclear Eng., College Park, MD 20742
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Abstract

Field emission current-voltage characteristics and simultaneous field emission electron energy distributions have been measured using single tip gate diodes. An energy distribution is generated at each step of a current-voltage characteristic using a compact low-cost simulated hemispherical energy analyzer. A PC programmed with graphics-based data acquisition software is used for data acquisition and control. The PC is connected to a CAMAC crate and a picoammeter through a GPIB interface. The picoammeter measures the current leaving the tip and the field emission electrons are energy analyzed, detected and processed in the CAMAC crate. The CAMAC crate also sends control voltages. to the gate anode and the energy analyzer. This apparatus was used to measure tip work functions and Fowler-Nordheim tip shape parameters for Mo and IrO2 field emission tips. Work function measurements from field emission tips are compared to photoelectric work function measurements from flat surfaces.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 558: Symposium B – Flat-Panel Displays and Sensors-Principles, Materials… , 1999 , 85
Copyright
Copyright © Materials Research Society 2000

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References

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