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In-Situ Liquid Transmission Electron Microscopy (TEM) for the analysis of Metal Organic Frameworks (MOFs)

Published online by Cambridge University Press:  27 August 2014

Joseph P. Patterson
Affiliation:
Department of Chemistry & Biochemistry, University of California, San Diego, La Jolla, California 92093, United States
Patricia Abellan Baeza
Affiliation:
Fundamental Computational Sciences Directorate and Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
Michael Denny Jr.
Affiliation:
Department of Chemistry & Biochemistry, University of California, San Diego, La Jolla, California 92093, United States
Seth Cohen
Affiliation:
Department of Chemistry & Biochemistry, University of California, San Diego, La Jolla, California 92093, United States
Chiwoo Park
Affiliation:
Department of Industrial and Manufacturing Engineering, Florida State University, Tallahassee, Florida 32306, United States
Nigel D. Browning
Affiliation:
Fundamental Computational Sciences Directorate and Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
James E. Evans
Affiliation:
Fundamental Computational Sciences Directorate and Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99354, United States
Nathan C. Gianneschi
Affiliation:
Department of Chemistry & Biochemistry, University of California, San Diego, La Jolla, California 92093, United States

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] de, J. N. and Ross, F. M., Nat. Nanotechnol., 2011, 6, 695-704.Google Scholar
[2] Zhou, H.-C., Long, J. R. and Yaghi, O. M., Chem. Rev., 2012, 112, 673-674.Google Scholar
[3] White, et al., Langmuir, 28, 3695, (2012)].Google Scholar
[4] Woehl, T. J., et al., Ultramicroscopy, 2013, 127, 53-63.Google Scholar