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An Analysis of Li Ion Secondary Battery Materials by Using Focused Ion Beam Micro-sampling Technique and Cold Field Emission Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  01 August 2010

T Tanigaki ,
K Ito ,
K Nakamura ,
Y Nagakubo ,
J Azuma  and
T Kanemura
T Tanigaki
Affiliation:
Hitachi High-Tech Manufacturing & Service Co, Japan
K Ito
Affiliation:
Hitachi High-Tech Manufacturing & Service Co, Japan
K Nakamura
Affiliation:
Hitachi High-Technologies Corporation, Japan
Y Nagakubo
Affiliation:
Hitachi High-Technologies Corporation, Japan
J Azuma
Affiliation:
Hitachi High-Technologies Corporation, Japan
T Kanemura
Affiliation:
Hitachi High-Tech Manufacturing & Service Co, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 214 - 215
Copyright
Copyright © Microscopy Society of America 2010