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The Optical Properties of the Interface Layer in CdS-CdTe Heterojunctions

Published online by Cambridge University Press:  01 February 2011

Sergiu A. Vatavu*
Affiliation:
Faculty of Physics, Moldova State University, 60 A.Mateevici str., Chisinau, MD 2009, Republic of Moldova
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Abstract

The photosensitivity and electro-reflection spectra of CdS/CdTe heterojunctions annealed up to one hour in presence of CdC12 have been studied. The lifetime of charge carriers, generated in the interface layer, has been determined.

The SnO2/CdS/CdTe/Ni thin films solar cells, deposited by close-spaced sublimation (CSS) technique are photosensitive in the 1.5-2.4 eV spectral region. The spectral distribution of photocurrent is not essentially modified by the increase of the annealing time. A slight decrease of the photocurrent in the 1.5-1.7 eV energy range is observed and the photocurrent slightly increases in the 1.7-2.4 eV region. The recombination of the nonequilibrium charge carriers in the interface layer takes place via recombination levels having a lifetime value, which decreases from 46 μs down to 30 μs along with photon energy increase from 1.55 eV to 2.4 eV respectively (T=293K). The correlation between the light penetration depth in component layers, estimated from the absorption spectral distribution and the photon energies was established.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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