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Windowless EDS Detection of N Lines and their Practical use in sub 2 kV X-ray mapping to Optimize Spatial Resolution

Published online by Cambridge University Press:  25 July 2016

Simon Burgess ,
James Holland ,
Peter Statham  and
Conor McCarthy
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
James Holland
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Peter Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Conor McCarthy
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 112 - 113
Copyright
© Microscopy Society of America 2016 

References

[1] Bearden, J. A. Rev Mod Phys (1967) 39, p78.Google Scholar
[2] Scheffel, A., et al, Microchim Acta (2008) 161, p471–473.Google Scholar