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Fast Drift-Scan CCD Imaging and Photometry with Small Telescopes: Lunar Occultations and Speckle Interferometry

Published online by Cambridge University Press:  12 April 2016

Jorge Núñez
Affiliation:
Departament d’Astronomia i Meteorologia, Universitat de Barcelona, Av. Diagonal 647, E-08028 Barcelona and Observatori Fabra, Barcelona, Spain. E-mail: jorge@am.ub.es
Octavi Fors
Affiliation:
Departament d’Astronomia i Meteorologia, Universitat de Barcelona, Av. Diagonal 647, E-08028 Barcelona and Observatori Fabra, Barcelona, Spain. E-mail: jorge@am.ub.es

Abstract

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In this paper we show how inherent features of typical CCD cameras can be used for fast (in the order of milliseconds) photometric observations (FPO), even with submeter class telescopes. This is based on a modified drift-scanning technique which we show to be advantageous for such kind of observations. In particular, we successfully carried out some lunar occultations and speckle interferometry observations using this technique. During the year 2000, we registered several occultation events. In particular, we present the occultation of SAO79031. The millisecond photometry of the event allows us subsequent data analysis for stellar diameter estimation and close binary detection. We also show an example of the application of the technique to speckle interferometry observations. Finally, we present the main characteristics of our project to build a new remotely controlled observatory near Barcelona.

Type
VII. Science With Small Telescopes
Copyright
Copyright © Astronomical Society of the Pacific 2001

References

Carter, B.D., Ashley, M.C.B., Sun, Y-S. & Storey, J.W.V. 1992, Proc. ASA, 10, 74.Google Scholar
Fors, O. & Núñez, J. 2001, in preparation.Google Scholar
Horch, E. 1995, int. J. Im. Syst. and Tech. 6, 4, 401.CrossRefGoogle Scholar
Horch, E., Ninkov, Z. & Slawson, R.W. 1997, AJ 114, 5, 2117.CrossRefGoogle Scholar
Kristian, J. & Blouke, M. 1982, Scientific American 247, 4, 48.CrossRefGoogle Scholar
Ragazzoni, R., Baruffolo, A., Farinato, J. 1998, Ghedina, A., Mallucci, S., Marchetti, E. & Niero, T., 1998, SPIE 3353, 132.Google Scholar
Richichi, A., Lisi, F. & Di Giacomo, A. 1992, A&A 254, 149.Google Scholar
Sabbey, C.N., Coppi, P. & Oemler, A. 1998, PASP 110, 1067.CrossRefGoogle Scholar
Stone, R.C., Monet, D.G., Monet, A.K.B., Walker, R.L. & Ables, H.D. 1996, AJ 111, 4, 1721.CrossRefGoogle Scholar