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Microstructural Evolution of Pb(Zr,Ti)O3 Ceramics Using Electron Paramagnetic Resonance

Published online by Cambridge University Press:  21 February 2011

W. L. Warren ,
B. A. Tuttle ,
R. W. Schwartz ,
W. F. Hammetter ,
D. C. Goodnow ,
J. T. Evans Jr.  and
J. A. Bullington
W. L. Warren
Affiliation:
Materials and Process Sciences Center, Sandia National Laboratories, Albuquerque, NM 87185-5800
B. A. Tuttle
Affiliation:
Materials and Process Sciences Center, Sandia National Laboratories, Albuquerque, NM 87185-5800
R. W. Schwartz
Affiliation:
Materials and Process Sciences Center, Sandia National Laboratories, Albuquerque, NM 87185-5800
W. F. Hammetter
Affiliation:
Materials and Process Sciences Center, Sandia National Laboratories, Albuquerque, NM 87185-5800
D. C. Goodnow
Affiliation:
Materials and Process Sciences Center, Sandia National Laboratories, Albuquerque, NM 87185-5800
J. T. Evans Jr.
Affiliation:
Radiant Technologies Inc., 1009 Bradbury Ave., Albuquerque, NM 87106
J. A. Bullington
Affiliation:
Radiant Technologies Inc., 1009 Bradbury Ave., Albuquerque, NM 87106
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Abstract

Using electron paramagnetic resonance (EPR) we have followed the microstructural evolution with temperature of lead zirconate titanate (PZT) ceramics from the amorphous to the perovskite phase. A number of paramagnetic point defects were identified (Carbon, Pb+3, and Ti+3) while traversing the evolution of these ceramics during various heat treatments both before and after optical illumination. Perhaps the most important finding is that the Pb+3 and Ti+3 centers can only be optically created in the perovskite materials, thereby, showing that they are not associated with the amorphous or the pyrochlore phases. It is also found that EPR signals attributed to carbon radicals are present in fairly high concentrations (4 × 1017/cm3) if the solution chemistry derived PZT materials are annealed in an oxygen deficient ambient (0.1% O2) at 650°C.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 310: Symposium N – Ferroelectric Thin Films III , 1993 , 3
Copyright
Copyright © Materials Research Society 1993

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