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Cathodoluminescence Study of V-defects in AlGaAs-based High-power Laser Bars

Published online by Cambridge University Press:  01 February 2011

Matthieu Pommies ,
Manuel Avella ,
Alonso Martin ,
Juan Jimenez ,
Myriam Oudart  and
Julien Nagle
Matthieu Pommies
Affiliation:
matthieupommies@cegetel.net, Universidad de Valladolid, Fisica de la Materia Condensada, ETSII, Paseo del Cauce s/n, Valladolid, 47011, Spain, 34 983423191, 34 983423192
Manuel Avella
Affiliation:
manuel@fmc.uva.es, Universidad de Valladolid, Fisica de la Materia Condensada, ETSII, Paseo del Cauce s/n, Valladolid, 47011, Spain
Alonso Martin
Affiliation:
alonsomm@libra.uva.es, Universidad de Valladolid, Fisica de la Materia Condensada, ETSII, Paseo del Cauce s/n, Valladolid, 47011, Spain
Juan Jimenez
Affiliation:
jimenez@fmc.uva.es, Universidad de Valladolid, Fisica de la Materia Condensada, ETSII, Paseo del Cauce s/n, Valladolid, 47011, Spain
Myriam Oudart
Affiliation:
myriam.oudart@thalesgroup.com, Alcatel Thales, 3-5 lab, RD 128, Palaiseau, 91767, France
Julien Nagle
Affiliation:
julien.nagle@thalesgroup.com, Thales Research and Technology, RD 128, Palaiseau, 91767, France
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Abstract

High-power semiconductor lasers are required to be more and more powerful, efficient and reliable for applications such as solid-state lasers pumping, materials processing, and thermal printing among others. The understanding of the degradation mechanisms is essential to improve the high power laser reliability. The highest power emission is achieved with multi-emitter laser cm-bars, which present problems related to packaging induced stress. A very harmful defect in this type of devices is the so-called V defect. We present herein a study of these defects using cathodoluminescence imaging, the role of packaging is discussed.

Keywords

defectslaserthermal stresses
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 994: Symposium F – Semiconductor Defect Engineering–Materials, Synthetic Structures and Devices II , 2007 , 0994-F07-03
Copyright
Copyright © Materials Research Society 2007

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