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Steps on the (110) Surface of INP
Published online by Cambridge University Press: 15 February 2011
Abstract
Three types of steps are observed on the cleaved InP(110) surface, using atomicresolution ultra-high vacuum (UHV) scanning tunneling microscopy (STM). The step edges are oriented along the (110), (111), and (112) directions. Atomic models of monatomic-height (111) and (112) steps indicate that the edges of each of these unrelaxed steps should have pairs of dangling bonds. We propose that the bonds dimerize, causing the edges to relax and form periodic structures along the edge.
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References
[1]
Ebert, Ph., Cox, G., Poppe, U., and Urban, K., J. Ultramicroscopy, 42–44, 871 (1992).CrossRefGoogle Scholar
[2]
Liang, Y., Ph. D.Thesis, University of Notre Dame, 1991. Available from University Microfilms, Ann Arbor, Michigan.Google Scholar
[3]
Liang, Y., Packard, W. E., and Dow, J. D., J. Vac. Sci. Technol. B
9, 730 (1991).CrossRefGoogle Scholar
[5] See, for example, the polyatomic step in Fig. 2.Google Scholar
[6]
Tong, S. Y., Lubinsky, A. R., Mrstik, B. J., and Van Hove, M. A., Phys. Rev. B
17, 3303 (1978); D. J. Chadi, Phys. Rev. B 18, 1800 (1978); D. J. Chadi, Phys. Rev. 19, 2074 (1979). See also the recent controversy over whether the surface relaxation angle depends on ionicity or not: Arguing for a dependence on ionicity are R. V. Kasowski, M.-H. Tsai, and J. D. Dow, J. Vac. Sci. Technol., B5, 953 (1987); M.-H. Tsai, J. D. Dow, R.-P. Wang, and R. V. Kasowski, Phys. Rev. B 40, 9818 (1989); Superlatt. Microstruct. 6, 431 (1989). J. L. A. Alves, J. Hebenstreit, and M. Scheffler, Phys. Rev. B 44, 6188 (1991), supported by low-energy positron diffraction data of X. M. Chen, G. R. Brandes, K. F. Canter, C. B. Duke, D. Paton, W. K. Ford, and D. L. Lessor, Bull. Amer. Phys. Soc. 37, 167 (1992). Arguing against such a dependence are C. B. Duke, R. J. Meyer, and P. Mark, J. Vac. Sci. Technol. 17, 971 (1980); W. Chen, M. Dumas, S. Ahsan, A. Kahn, C. B. Duke, and A. Paton, J. Vac. Sci. Technol. A 10, 2071 (1992); and A. Kahn, S. Ahsan, W. Chen, M. Dumas, C. B. Duke, and A. Paton, Phys. Rev. Letters 68, 3200 (1992).CrossRefGoogle Scholar