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Analysis of Interface Dynamics in Solid-State Phase Transformations by In Situ Hot-Stage High-Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  21 February 2011

James M. Howe ,
W. E. Benson ,
A. Garg  and
Y.-C. Chang
James M. Howe
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903, U.S.A.
W. E. Benson
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22903, U.S.A.
A. Garg
Affiliation:
NASA Lewis Research Center, 21000 Brookpark Road, Cleveland, OH 44135, U.S.A.
Y.-C. Chang
Affiliation:
Aeronautical Research Laboratory, Chung-Shan Institute of Science and Technology, P.O. Box 90008-11-12, Taichung City, Taiwan, R.O.C
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Abstract

In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the dynamics of interfaces at the atomic level. Such information is critical for understanding the theory of interfaces and solid-state phase transformations. This paper provides a brief description of particular requirements for performing in situ hot-stage HRTEM, summarizes different types of in situ HRTEM investigations and illustrates the use of this technique to obtain quantitative data on the atomic mechanisms and kinetics of interface motion in precipitation, crystallization and martensitic reactions. Some limitations of in situ hot-stage HRTEM and future prospects of this technique are also discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 65
Copyright
Copyright © Materials Research Society 1994

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