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The Importance of the Fringing Field Surrounding a Tem Foil to the Quantification of Phase Contrast at a P-N Junction

Published online by Cambridge University Press:  10 February 2011

R. E. Dunin-Borkowski  and
W. O. Saxton
R. E. Dunin-Borkowski
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK
W. O. Saxton
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK
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Abstract

The space charge contribution to the electrostatic potential both inside and outside a dielectric slab containing a p-n junction is calculated using classical electrostatics, with particular reference to the use of phase contrast techniques in transmission electron microscopy for the characterisation of the carrier distributions present at such layers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 466: Symposium G – Atomic Resolution Microscopy of Surfaces and Interfaces , 1996 , 73
Copyright
Copyright © Materials Research Society 1997

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References

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