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Frequency-Dependent Thermal Conductivity in Time Domain Thermoreflectance Analysis of Thin Films

Published online by Cambridge University Press:  11 August 2011

Gilles Pernot ,
Hélène Michel ,
Bjorn Vermeersch ,
Peter Burke ,
H. Lu ,
Jean-Michel Rampnoux ,
Stefan Dilhaire ,
Younès Ezzahri ,
Arthur Gossard  and
Ali Shakouri
Gilles Pernot*
Affiliation:
Department of Electrical Engineering, University of California Santa Cruz, Santa Cruz, CA 95064, U.S.A.
Hélène Michel
Affiliation:
Department of Electrical Engineering, University of California Santa Cruz, Santa Cruz, CA 95064, U.S.A.
Bjorn Vermeersch
Affiliation:
Department of Electrical Engineering, University of California Santa Cruz, Santa Cruz, CA 95064, U.S.A.
Peter Burke
Affiliation:
Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, U.S.A.
H. Lu
Affiliation:
Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, U.S.A.
Jean-Michel Rampnoux
Affiliation:
LOMA, Université de Bordeaux 1, 33405 Talence, France.
Stefan Dilhaire
Affiliation:
LOMA, Université de Bordeaux 1, 33405 Talence, France.
Younès Ezzahri
Affiliation:
Institut Pprime, CNRS-Université de Poitiers-ENSMA, 86022 Poitiers, France.
Arthur Gossard
Affiliation:
Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, U.S.A.
Ali Shakouri
Affiliation:
Department of Electrical Engineering, University of California Santa Cruz, Santa Cruz, CA 95064, U.S.A.
*
*pgilles@soe.ucsc.edu
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Abstract

Over the past three decades, ultrashort laser pulses have been demonstrated to be a very powerful tool to investigate materials properties at the nanoscale. A key driving force is the high-time resolution required to study heat transfer across interfaces and in thin films. The Time-Domain Thermoreflectance (TDTR) is now widely used. This optical technique offers an interesting alternative to electrical approaches such as the 3ω method. We present a complete study of the TDTR signals. We investigate the influence of the modulation frequency on the measured signals and we show how this experimental parameter could be set to enhance or reduce the sensitivity to a specific thermal parameter. The dependence of the measured “apparent” thermal conductivity of the thin film as a function of the modulation frequency is discussed. Results are applied to investigate thermal properties of a series of InGaAs samples with embedded ErAs nanoparticles.

Keywords

nanoscalethermal conductivitythin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1347: Symposium BB – Nanoscale Heat Transport—From Fundamentals to Devices , 2011 , mrss11-1347-bb07-07
Copyright
Copyright © Materials Research Society 2011

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References

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