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Transient Response and Space Charge Effects in Extrinsic Photoconductors

Published online by Cambridge University Press:  21 February 2011

N. M. Haegel
Affiliation:
Department of Materials Science and Engineering, University of California, Los Angeles Los Angeles, CA 90024
C. A. Latasa
Affiliation:
Department of Materials Science and Engineering, University of California, Los Angeles Los Angeles, CA 90024
G. L. Fong
Affiliation:
Department of Materials Science and Engineering, University of California, Los Angeles Los Angeles, CA 90024
A. M. White
Affiliation:
Defense Research Agency, Royal Signals and Radar Establishment, Great Malvern, England
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Abstract

Transient response times for extrinsic photoconductors under constant voltage bias have been calculated using a variable finite-difference technique. We find that the transient response to a step function increase in photon signal is determined by the build-up of a space charge barrier to counteract out-diffusion and sweep-out. Transient times on the order of 10−2 – 10−4 s are found for 20–500 μm thick detectors under the photon backgrounds typical of infrared astronomy and other low background spectroscopy applications.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

[1] Bratt, P. R., in Semiconductors and Semimetals, Vol.12, edited by Willardson, R. K. and Beer, A. C. (Academic, New York, 1977), p. 39.Google Scholar
[2] Richards, P. L. and Greenberg, L. T., Infrared and Millimeter Waves, Vol.6, edited by Button, K. (Academic Press, New York, 1982), p. 150.Google Scholar
[3] Williams, R. L., J. Appl. Phys. 38, 4802, (1967).Google Scholar
[4] Williams, R. L., J. Appl. Phys. 40, 184 (1969).Google Scholar
[5] Westervelt, R. M. and Teitsworth, S. W., J. Appl. Phys. 57, 5457 (1985).Google Scholar
[6] Haegel, N. M., Beeman, J. W., Luke, P. N. and Haller, E. E., Phys. Rev. B 39, 3677 (1989).Google Scholar
[7] White, A. M., Infrared Physics 25, 729 (1985).CrossRefGoogle Scholar
[8] Haegel, N. M. and White, A. M., Infrared Physics 29, 915 (1989).Google Scholar
[9] Greenberg, Michael D., Foundations of Applied Mathematics (Prentice-Hall, New Jersey, 1978), p. 605.Google Scholar
[10] Haegel, N. M., Latasa, C. A. and White, A. M., submitted to J. Appl. Phys.Google Scholar