Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-19T19:49:40.192Z Has data issue: false hasContentIssue false

Short-channel and high-mobility p- and n-type organic single-crystal transistors with air-gap structures

Published online by Cambridge University Press:  23 February 2012

M. Uno*
Affiliation:
TRI Osaka, Izumi, Osaka 594-1157, Japan ISIR, Osaka University, Ibaraki, Osaka 567-0047, Japan
T. Uemura
Affiliation:
ISIR, Osaka University, Ibaraki, Osaka 567-0047, Japan
K. Miwa
Affiliation:
ISIR, Osaka University, Ibaraki, Osaka 567-0047, Japan
A. Facchetti
Affiliation:
Polyera Corporation, Skokie, Illinois 60077, USA
J. Takeya
Affiliation:
ISIR, Osaka University, Ibaraki, Osaka 567-0047, Japan
Get access

Abstract

In an effort to realize high-speed organic logic components, p- and n-type single-crystal organic field-effect transistors (SC-OFETs) were fabricated using air-gap structures with channel lengths as short as several μm. High carrier mobility of about 10 cm2/Vs is demonstrated in rubrene SC-OFETs even with the short channel length of 6 μm, using Si-based microstructures. The contact resistance is estimated to be 450 Ohm cm, which is only 5% of the total channel resistance between source and drain electrodes. Performances of n-type air-gap devices based on PDIF-CN2 are also demonstrated exhibiting electron transport with the carrier mobility of about 2 cm2/Vs. Furthermore, micron-scale air-gap structures are fabricated using insulating materials on glass substrates to reduce parasitic gate capacitance. The cut-off frequency of this rubrene air-gap device is measured to be as high as 8 MHz with applied drain voltage VD of 15 V. These techniques are promising to be applicable to next-generation organic high-speed logic circuits.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Podzorov, V., Menard, E., Borissov, A., Kiryukhin, V., Rogers, J. A., and Gershenson, M. E., Phys. Rev. Lett. 93, 086602 (2004).Google Scholar
2. Takeya, J., Yamagishi, M., Tominari, Y., Hirahara, R., Nakazawa, Y., Nishikawa, T., Kawase, T., and Shimoda, T., Appl. Phys. Lett. 90, 102120 (2007).Google Scholar
3. de Boer, R. W. I., Klapwijk, T. M., and Morpurgo, A. F., Appl. Phys. Lett. 83, 4342 (2003).Google Scholar
4. Molinari, A. S., Alves, H., Chen, Z., Facchetti, A., and Morpurgo, A. F., J. Am. Chem. Soc. 131, 2462 (2009).Google Scholar
5. Gundlach, D. J., Zhou, L., Nichols, J. A., Jackson, T. N., Necliudovc, P. V., and Shur, M. S., J. Appl. Phys. 100, 024509 (2006).Google Scholar
6. Wagner, V., Wobkenberg, P., Hoppe, A, and Seekamp, J., Appl. Phys. Lett. 89, 243515 (2006).Google Scholar
7. Kitamura, M. and Arakawa, Y., Appl. Phys. Lett. 95, 023505 (2009).Google Scholar