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A Rapid Screening Method for Investigating the Effect of Processing Parameters on CdTe/CdS Solar Cell Performance

Published online by Cambridge University Press:  31 January 2011

Mohammed Al Turkestani
Affiliation:
mohammed.alturkestani@dur.ac.uk, Durham University, Physics Department, South Road, Durham, DH1 3LE, United Kingdom
Ken Durose
Affiliation:
ken.durose@dur.ac.uk, Durham University, Physics Department, Durham, United Kingdom
Ben Wakeling
Affiliation:
b.r.wakeling@cranfield.ac.uk, Cranfield University, Dept of Materials and Medical Sciences, Swindon, United Kingdom
David Lane
Affiliation:
d.w.lane@cranfield.ac.uk, Cranfield University, Dept of Materials and Medical Sciences, Swindon, United Kingdom
Stuart Irvine
Affiliation:
stuart.irvine@optictechnium.com, Glyndŵr University, Centre for Solar Energy Research, St Asaph, United Kingdom
Vincent Barrioz
Affiliation:
vincent.barrioz@optictechnium.com, Glyndŵr University, Centre for Solar Energy Research, St Asaph, United Kingdom
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Abstract

A rapid screening method is reported in which material processing parameters are investigated as a function of the CdTe absorber thickness in CdTe/CdS solar cells. It has been used to investigate i) the optimum absorber thickness for CdCl2 processing at 380°C for 10 mins, and ii) the effect on device performance of post-growth annealing of CdS layer with H2, N2, and O2. It was found that the optimum thickness of CdTe compatible with the processing was ∼3μm. The device results were independent of the post-growth treatment of the CdS for the conditions investigated here. The bevel method allowed for ∼30 data points to be obtained from each sample, this giving a significant advantage over conventional experimental methods.

Keywords

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

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References

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