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Characterisation of Organic Semiconductor Growth using Real-time Electron Spectroscopy

Published online by Cambridge University Press:  07 March 2011

D. Andrew Evans ,
Owain R. Roberts ,
Gruffudd T. Williams  and
David. P. Langstaff
D. Andrew Evans
Affiliation:
Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth SY23 3BZ, U.K.
Owain R. Roberts
Affiliation:
Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth SY23 3BZ, U.K.
Gruffudd T. Williams
Affiliation:
Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth SY23 3BZ, U.K.
David. P. Langstaff
Affiliation:
Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth SY23 3BZ, U.K.
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Abstract

An organic molecular beam deposition system coupled to a soft x-ray excitation source has been developed to monitor the growth of organic semiconductor thin films in-situ and in real-time. Rapid collection of photoelectron spectra has been enabled using a multichannel array detector coupled to a hemispherical analyzer. The organic semiconductor tin phthalocyanine (SnPc) exhibits a Stranski-Krastanov growth mode on a polycrystalline gold substrate where the transition thickness between layered and clustered growth has been determined to be comparable to the thickness of a single molecular layer within which the molecules are standing on edge relative to the substrate plane.

Keywords

photoemissionsemiconductingthin film
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1318: Symposium SS/TT/UU/VV – Advances in Spectroscopy and Imaging of Surfaces and Nanostructures , 2011 , mrsf10-1318-uu09-05
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

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