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Tem, Raman, and Langmuir Probe Studies of the Heteroepitaxial Growth of Metastable Cd(x)pb (1–X) Te Alloys Deposited on BaF2 by Low-Energy Bias Sputtering

Published online by Cambridge University Press:  26 February 2011

Suhit R. Das ,
John G. Cook  and
David J. Lockwood
Suhit R. Das
Affiliation:
Institute for Microstructural Sciences, National Research Council of Canada, Ottawa, Ontario K1A 0R6, Canada
John G. Cook
Affiliation:
Institute for Microstructural Sciences, National Research Council of Canada, Ottawa, Ontario K1A 0R6, Canada
David J. Lockwood
Affiliation:
Institute for Microstructural Sciences, National Research Council of Canada, Ottawa, Ontario K1A 0R6, Canada
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Abstract

Metastable Cd(x)Pb(1–x)Te films with x values from 0 to 0.47, well past the range of bulk thermodynamic solubility, have been grown on single crystal (lll) BaF2 by co-deposition from CdTe and PbTe r.f. magnetron sputter targets. Cross-sectional transmission electron microscopy and transmission electron diffraction revealed epitaxial growth across the interface. However, the lattice of the deposited epilayers was observed to be typically rotated 180°C about the surface normal <111> axis of the substrate. Raman spectra of the alloys showed no evidence of segregation. Langmuir probe diagnostics were employed to estimate the energy of the ions incident on the substrate during growth which promote extended miscibility in the alloy epilayers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 201: Symposium A – Surface Chemistry and Beam-Solid Interactions , 1990 , 63
Copyright
Copyright © Materials Research Society 1991

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