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Two Different Interactions between Oxygen Vacancies and Dopant Cations for Ionic Conductivity in CaO-Doped CeO2 Electrolyte Materials

Published online by Cambridge University Press:  18 March 2011

Yuanzhong Zhou  and
Xi Chen
Yuanzhong Zhou
Affiliation:
Department of Physics, Huazhong University of Science and Technology, Wuhan, China
Xi Chen
Affiliation:
Department of Physics, Huazhong University of Science and Technology, Wuhan, China
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Abstract

The electrical measurement has demonstrated that conductivity of CaO-doped CeO2 has higher activation energy for low temperature and lower activation energy for high temperature. A model with two different kinds of defect interactions between oxygen vacancy and doped cations has been used to interpret the phenomenon. Diffusion based on hopping of oxygen ions was assumed as the mechanism of electrical conduction. The analysis indicated that at high temperature free oxygen vacancies are dominant and the activation energy is only for oxygen ion hopping. At low temperature, however, oxygen vacancies associated with dopant calcium ions are dominant for high CaO content and the activation energy is the energy for hopping of an oxygen ion plus half of the association energy between one oxygen vacancy and one calcium ion. For low level doping, both free and associated oxygen vacancies are important.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 658: Symposium GG – Solid-State Chemistry of Inorganic Materials III , 2000 , GG99.1
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

[1]Mogensen, M., Sammes, N., and Tompsett, G., Solid State Ionics, vol. 129, 63 (2000)Google Scholar
[2]Inaba, H. and Tagawa, H., Solid State Ionics, vol. 83, 1 (1996)Google Scholar
[3]Kudo, T. and Obayashi, H., J. Electrochem. Soc., vol. 122, 142(1975)Google Scholar
[4]Hohnke, D. K., Solid State Ionics, vol. 5, 531(1981)Google Scholar
[5]Dirstine, R. T., Blumenthal, R. N., and Kuech, T. F., J. Electrochem. Soc., vol. 126, 264(1979)Google Scholar
[6]Bulter, V., Catlow, C. R.A., Fender, B. E. F., and Harding, J. H., Solid State Ionics, vol. 8, 109 (1983)Google Scholar
[7]Chebotin, V. N. and Mezrin, V. A., Phys. Status Solidi (a), vol. 89, 199(1985)Google Scholar
[8]Kilner, J. A. and Steele, B. C. H., in: Nonstoichiometric Oxides, ed. Sorensen, O. T., Academic Press, New York, 1981 Google Scholar
[9]Kilner, J. A. and Waters, C. D., Solid State Ionics, vol. 6, 253 (1982)Google Scholar
[10]Wang, D. Y., Park, D. S., Griffith, J., and Nowick, A. S., Solid State Ionics, vol. 2, 95(1981)Google Scholar
[11]Solier, J.D., Cachadina, I., and Dominguez-Rodriguez, A., Phys. Rev. B48, 3704(1993)Google Scholar