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Grazing Incidence X-Ray Diffraction Study of A Glass-Liquid Crystal Buried Interface

Published online by Cambridge University Press:  15 February 2011

L. J. Martínez Miranda
L. J. Martínez Miranda*
Affiliation:
Department of Materials and Nuclear Engineering, University Of Maryland, College Park, MD. 20742-2115; Department of Physics and Liquid Crystal Institute, Kent State University, Kent, OH 44242–0001
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Abstract

We have used Grazing Incidence X-ray Diffraction to study the structure of a liquid crystal (LC) at the buried LC-glass interface in micrometer size LC films. This measurement is done in reflection mode through the glass substrate, which consists of a grating photolithographed onto a 0.2mm slide. This experiment was performed in beamline X22B of the National Synchrotron Light Source at Brookhaven National Laboratory, using 1.3776Å X-ray radiation. We have used both the glass and LC absorption properties to control the penetration depth of the beam into the LC film bulk. The ability to measure LC interfaces in this manner is essential to study any LC device, arid its response to applied fields.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 437: Symposium DD – Applications of Synchrotron Radiation to III , 1996 , 33
Copyright
Copyright © Materials Research Society 1996

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