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Atomic Force Microscopy Applications to Neuroscience

Published online by Cambridge University Press:  15 March 2011

Helen A. McNally
Helen A. McNally*
Affiliation:
Center for Paralysis Research Purdue University, West Lafayette, IN 47907mcnallyh@purdue.edu
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Abstract

In this research, Atomic Force Microscopy (AFM) is used to investigate living neurons. Three-dimensional images of developing and dying neurons have been obtained, providing neuroscientists their first views of these dynamic structures. The unparalleled resolution provided by AFM reveals dorsal root ganglion (DRG) cells to be more complex and variable than anticipated. AFM is also used to physically contact or manipulate the cell, and thus perturb its development, and/or to measure important physiologically parameters such as surface pressure. Neural cell damage is induced by the AFM tip, which is subsequently used to image the cell's morphological response. A 3-D view of the neural cell collapse, due to this insult, suggests alternative ideas concerning acute neuronal (cellular) sealing and repair. Repair of the injured neuron using electric fields and biomolecules is also investigated, supporting clinical trials for paralysis research. AFM force measurements are used to monitor cellular activity and membrane interactions during various stages of the neural cell life cycle. The full versatility of AFM will be applied to further the understanding of neurogenesis and neurotrauma.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 820: Symposia O/R – Nanoengineered Assemblies and Advanced Micro/Nanosystems , 2004 , R6.4
Copyright
Copyright © Materials Research Society 2004

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