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Single- and Multi-target Pulsed Laser Deposition of Thin BSTO films: Preparation, Microstructure and Electrical Properties

Published online by Cambridge University Press:  01 February 2011

Kumaravinothan Sarma
Affiliation:
Centre for Physical Electronics and Materials Centre, Faculty of Engineering, Science and Built Environment, London South Bank University, SE1 0AA, UK.
Peter Kr. Petrov
Affiliation:
Centre for Physical Electronics and Materials Centre, Faculty of Engineering, Science and Built Environment, London South Bank University, SE1 0AA, UK.
Neil McN. Alford
Affiliation:
Centre for Physical Electronics and Materials Centre, Faculty of Engineering, Science and Built Environment, London South Bank University, SE1 0AA, UK.
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Abstract

A comparative study of microstructure and electrical properties of BaxSr1-xTiO3 films made by single- and multi-target pulsed laser deposition was carried out. The films were epitaxially grown on both LaAlO3 and MgO substrates. The structural properties of all samples were investigated using X-ray diffraction and Raman spectroscopy. The elemental composition of the samples was investigated using energy dispersive X-ray analysis. For electrical properties examination, a simple capacitor structure was patterned on the film surface. Thin films made using both methods exhibit similar structural and electrical properties; however the samples made by a multi-target method underwent phase transition in a broader temperature region. The results prove the possibility of using the multi-target pulse laser deposition as a more flexible method for engineering thin film stoichometry.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Lancaster, M.J., Powell, J. and Porch, A., Supercond Sci Technol, 11, pp 1323, 1998.Google Scholar
2. Petrov, P.K., Carlsson, E.F., Larsson, P., Friesel, M. and Ivanov, Z.G., J Appl Phys, 1998; 84: 31343140 Google Scholar
3. Vendik, O.G., Hollmann, E.K. and Prudan, A.M.,, J Supercond, 1999; 12(2)Google Scholar
4. Haertling, G.H., J. Am. Ceram. Soc. 82 [4] 797818 (1999).Google Scholar
5. Petrov, P.K., Sarma, K. and Alford, N. MCN., Ferroelectrics, Article in Press.Google Scholar
6. Petrov, P.K., Ivanov, Z.G., and Gevorgyan, S.S., Materials Science and Engineering, A288, (2000)Google Scholar
7. Dobal, P.S., Dixit, A., Katiyar, R.S., Garcia, D, Guo, R. and Bhalla, A.S., Ferro. Lett. 29(3–4), pp 110, 2002 Google Scholar
8. Katiyar, R.S., Jain, M. and Yu. I., and Yuzuk, , Freeoelectrics, (Article in press).Google Scholar
9. Pertov, P.K., Paper presented in MRS 2003 Symposium C, (Paper ID. 582, Paper No. 48518).Google Scholar
10. Petrov, P.K., Alford, N.McN., Astafiev, K.F., Tagantsev, A.K., Setter, N., Kaydanova, T. and Ginley, D.S., Integrated Ferroelectrics, Article in press.Google Scholar