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High-energy X-ray applications: current status and new opportunities

Published online by Cambridge University Press:  30 January 2018

Dubravka Šišak Jung*
Affiliation:
DECTRIS Ltd, Täfernweg 1, 5405 Baden-Dättwil, Switzerland
Tilman Donath
Affiliation:
DECTRIS Ltd, Täfernweg 1, 5405 Baden-Dättwil, Switzerland
Oxana Magdysyuk
Affiliation:
Diamond Light Source, Didcot, United Kingdom
Jozef Bednarcik
Affiliation:
Deutsches Elektronen-Synchrotron, Notkestrasse 85, Hamburg, Germany
*
a)Author to whom correspondence should be addressed. Electronic mail: dubravka.sisak@dectris.com

Abstract

Characterization of semi and noncrystalline materials, monitoring structural phase transitions in situ, and obtaining structural information together with spatial distribution of the investigated material are only a few applications that hugely benefitted from the combination of high-energy X-rays and modern algorithms for data processing. This work examines the possibility of advancing these applications by shortening the data acquisition and improving the data quality by using the new high-energy PILATUS3 CdTe detector.

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2018 

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