Hostname: page-component-8448b6f56d-qsmjn Total loading time: 0 Render date: 2024-04-19T20:30:22.284Z Has data issue: false hasContentIssue false

Preparation and Luminescence of Europium Doped Zinc Silicate Phosphor

Published online by Cambridge University Press:  10 February 2011

H. X. Zhang
Affiliation:
Photonics Research Group, Microelectronics Division, School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, ehxzhang@ntu.edu.sg
Y. Zhou
Affiliation:
Photonics Research Group, Microelectronics Division, School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, ehxzhang@ntu.edu.sg
C. H. Kam
Affiliation:
Photonics Research Group, Microelectronics Division, School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, ehxzhang@ntu.edu.sg
Y. L. Lam
Affiliation:
Photonics Research Group, Microelectronics Division, School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, ehxzhang@ntu.edu.sg
Y. C. Chan
Affiliation:
Photonics Research Group, Microelectronics Division, School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, ehxzhang@ntu.edu.sg
Get access

Abstract

Europium doped zinc silicate (Eu:Zn2SiO4) phosphors in the forms of nanoscale powder and film has been prepared by sol-gel method. XRD analysis indicz: ed that the powders have willemite structure with a small amount of triclinic structure and the filn has, pure willemite structure. Photoluminescence measurement showed that strong red emission of Eu3+5D07 F2transition could be obtained under excitation at both 256 and 393 nm. Luminescence decay of the emission under 393 nm excitation can be fitted by a single exponential, yielding a decay time τ =1.43 ms; and the luminescence under 256 nm excitation shows double exponential decay with a slow decay time τs,=2.13 ms and a fast decay time τf =2.05 ms.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Liu, J., Morton, D. C., Miller, M. R., Li, Y., Forthsythe, E. W., and Tompa, G. S., in Flat Panel Display Materials Proceedings (Mater. Res. Soc. Proc. 471, San Francisco, CA 1997), p. 305.Google Scholar
2. Yocom, N., Meltzer, R. S., Jang, K. W., and Rim, M., J. of the Soc. for Information Display 4, p. 169 (1996).Google Scholar
3. Ouyang, X., Kitai, A. H., and Xiao, T., J. Appl. Phys. 79, p. 3,229 (1996).Google Scholar
4. Ouyang, X., Kitai, A. H., and Siegele, R., Thin Solid Films 254, p. 268 (1995).Google Scholar
5. Nikl, M., Morlotti, R., and Bracco, R., J. Appl. Phys. 79, p. 2,853 (1996).Google Scholar
6. Amekura, H., Eckau, A., Carius, R., and Buchal, C., J. Appl. Phys. 84, p. 3,867 (1998).Google Scholar
7. Jin, T., Inoue, S., Tsutsumi, S., Machida, K., and Adachi, G., J. Non-Crystalline Solids 223, p. 123 (1998).Google Scholar
8. Cich, M., Kin, K., Choi, H. and Hwang, S. T., Appl. Phys. Lett. 73, p. 2,116 (1998).Google Scholar
9. Rao, R. P., J. Electrochem. Soc. 143, p. 189 (1996).Google Scholar
10. Jones, S. L., Kumar, D., Singh, R. K., and Holloway, P. H., Appl. Phys. Lett. 71, p. 404 (1997).Google Scholar
11. Cho, K. G., Kumar, D., Holloway, P. H., and Singh, R. K., Appl. Phys. Lett. 73, p. 3,058 (1998).Google Scholar
12. Alias, D., Hisanori, F., Koutoku, O., Shosaku, T., and Horishi, K., J. of the Soc. for Information Display 4, p. 193 (1996),Google Scholar
13. Gao, Y. and Shi, C., J. Phys. & Chm. Solids 57, p. 1,303 (1996).Google Scholar