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Morphological characterization of fullerene and fullerene-free organic photovoltaics by combined real and reciprocal space techniques

Published online by Cambridge University Press:  02 May 2017

Subhrangsu Mukherjee Open the ORCID record for Subhrangsu Mukherjee [Opens in a new window] ,
Andrew A. Herzing ,
Donglin Zhao ,
Qinghe Wu ,
Luping Yu ,
Harald Ade ,
Dean M. DeLongchamp  and
Lee J. Richter
Subhrangsu Mukherjee
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
Andrew A. Herzing
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
Donglin Zhao
Affiliation:
Department of Chemistry and The James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA
Qinghe Wu
Affiliation:
Department of Chemistry and The James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA
Luping Yu
Affiliation:
Department of Chemistry and The James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA
Harald Ade
Affiliation:
Department of Physics and Organic and Carbon Electronics Laboratory, North Carolina State University, Raleigh, North Carolina 27695, USA
Dean M. DeLongchamp
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
Lee J. Richter*
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
*
a) Address all correspondence to this author. e-mail: lee.richter@nist.gov
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Abstract

Morphology can play a critical role in determining function in organic photovoltaic (OPV) systems. Recently molecular acceptors have showed promise to replace fullerene derivatives as acceptor materials in bulk heterojunction solar cells and have achieved >10% efficiencies in single junction devices. The nearly identical mass/electron densities between the donor (polymer) and acceptor (molecule) materials results in poor material contrast compared to fullerene-based OPVs and therefore morphology characterization using techniques that rely on mass/electron density variations poses a challenge. This inhibits a fundamental understanding of the structure–property relationships for non-fullerene acceptor materials. We demonstrate that low angle annular dark field scanning transmission electron microscopy and resonant soft X-ray scattering form a set of complementary tools that can provide quantitative characterization of fullerene as well as non-fullerene based organic photovoltaic systems.

Keywords

morphologyorganicphotovoltaic
Type
Invited Articles
Information
Journal of Materials Research , Volume 32 , Issue 10: Focus Issue: Microstructural Characterization for Emerging Photovoltaic Materials , 26 May 2017 , pp. 1921 - 1934
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Copyright
Copyright © Materials Research Society 2017 

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Footnotes

b)

This author was an editor of this journal during the review and decision stage. For the JMR policy on review and publication of manuscripts authored by editors, please refer to http://www.mrs.org/editor-manuscripts/.

Contributing Editor: Moritz Riede

References

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