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Solid surface free energy analysis using inkjet droplets

Published online by Cambridge University Press:  21 March 2012

Kazuhiro Fukada ,
Hayato Sakai ,
Taku Hasobe ,
Takashi Masuda  and
Tatsuya Shimoda
Kazuhiro Fukada
Affiliation:
School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa, Japan
Hayato Sakai
Affiliation:
Department of Chemistry, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa, Japan
Taku Hasobe
Affiliation:
Department of Chemistry, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa, Japan PRESTO, Japan Science and Technology Agency (JST), 4-1-8 Honcho, Kawaguchi, Saitama, Japan
Takashi Masuda
Affiliation:
Japan Science and Technology Agency, ERATO, Shimoda Nano-Liquid Process Project, 2-5-3 Asahidai, Nomi, Ishikawa, Japan
Tatsuya Shimoda
Affiliation:
School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa, Japan Japan Science and Technology Agency, ERATO, Shimoda Nano-Liquid Process Project, 2-5-3 Asahidai, Nomi, Ishikawa, Japan
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Abstract

We measured the surface free energy of a substrate by transmission electron microscopy (TEM) using sub-millimetre-sized inkjet droplets. By employing two types of TEM grids with different surface free energies, we investigated the relationship between the surface energy and the patterns of an organic solution dried on the grids. We confirmed that the generation of the porphyrin hexamer [(H2PAC15)6TPh] patterns was affected by the surface free energy of the TEM grid.

Keywords

self-assemblytransmission electron microscopy (TEM)solution deposition
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1360: Symposium OO – Synthesis and Processing of Organic and Polymeric Materials for Semiconductor Applications , 2011 , mrss11-1360-oo15-10
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. Hasobe, T., et al. ., Chem. Commun. 46 (2010) 889–891 Google Scholar
2. van Hamern, R., et al. ., Science 314 (2006)1433–1436 Google Scholar
3. van Oss, C.J., Colloid Surfaces A: Physicochem Eng. Aspects 78 (1993)1–49 Google Scholar
4. Della Volpe, C., et al. ., J Colloid Interface Sci. 271 (2004) 434–453 10.1016/j.jcis.2003.09.049Google Scholar
5. Deegan, R. D., et al. ., Nature 389 (1997) 827–829 Google Scholar
6. Deegan, R. D., et al. ., Phys. Rev. E 62 (2000) 756–765 Google Scholar
7. Deegan, R. D., et al. ., Phys. Rev. E 61 (2000) 475–483 Google Scholar
8. Hu, H., et al. ., Langmuir 21 (2005) 3972–3980 Google Scholar
9. Hu, H., et al. ., J. Phys. Chem. B 110 (2006) 7090–7094 Google Scholar
10. Israelachvili, J. N., Intermolecular and Surface Force, Academic Press Limited: London, 1992 Google Scholar
11. Malaquin, L., et al. ., Langmuir 23 (2007) 11513–11521 Google Scholar
12. Adachi, E., et al. ., Langmuir 11 (1995) 1057–1060 Google Scholar
13. Shmuylovich, L., et al. ., Langmuir 18 (2002) 3441–3445 Google Scholar