Hostname: page-component-8448b6f56d-wq2xx Total loading time: 0 Render date: 2024-04-24T03:39:40.616Z Has data issue: false hasContentIssue false
  • English
  • Français

Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

Published online by Cambridge University Press:  09 October 2013

N. Alem ,
Q.M. Ramasse ,
O.V. Yazyev ,
C.R. Seabourne ,
C.K. Kisielowski ,
P. Hartel ,
B. Jiang ,
R. Erni ,
K. Erickson  and
M. Sarahan
...Show all authors
N. Alem
Affiliation:
Q.M. Ramasse
Affiliation:
O.V. Yazyev
Affiliation:
C.R. Seabourne
Affiliation:
C.K. Kisielowski
Affiliation:
P. Hartel
Affiliation:
B. Jiang
Affiliation:
R. Erni
Affiliation:
K. Erickson
Affiliation:
M. Sarahan
Affiliation:
M. Rossell
Affiliation:
A. Scott
Affiliation:
S. Louie
Affiliation:
A. Zettl
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 618 - 619
Copyright
Copyright © Microscopy Society of America 2013