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Fluence Dependence of Thermoelectric Properties Induced By Ion Bombardment of Zn4Sb3 and CeFe2Co2Sb12 thin films

Published online by Cambridge University Press:  01 February 2011

C.C. Smith
Affiliation:
cmems@hotmail.com, NASA, MSFC, MSFC, Huntsville, AL, AL, 35812, United States
S. Budak
Affiliation:
sbudak@cim.aamu.edu, Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Normal, AL, 35762, United States
S. Guner
Affiliation:
sguner@cim.aamu.edu, Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Normal, AL, 35762, United States
C. Muntele
Affiliation:
claudiu@cim.aamu.edu, Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Normal, AL, 35762, United States
R. A. Minamisawa
Affiliation:
renato@cim.aamu.edu, Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Normal, AL, 35762, United States
R. L. Zimmerman
Affiliation:
rlzimm@cim.aamu.edu, Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Normal, AL, 35762, United States
D. ILA
Affiliation:
ila@cim.aamu.edu, Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Normal, AL, 35762, United States
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Abstract

Thermoelectric power generation is a promising technology for increasing the efficiency of electrical and optical electrical devices. We prepared samples by Electron Beam evaporating Zn4Sb3 and CeFe2Co2Sb12 thin films on silicon dioxide (silica) substrates. The materials were co-evaporated and then were prepared for gold over-coating. Following electron deposition we performed post ion bombardment at a constant energy of 5 MeV while varying fluence from 1×1012, 1×1013, 1×1014, 1×1015 ions/cm2, respectfully. The production of nano-clusters generated from the MeV Si ions bombardment modifies the electrical and phonon interactions in the materials. Also, we will report on the fluence dependence of the figure of merit, Seebeck Coefficient, thermal conductivity and electrical conductivity. In addition, Rutherford backscattering spectrometry (RBS) was used to analyze the elemental composition and the thickness of the deposited material.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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