Hostname: page-component-8448b6f56d-sxzjt Total loading time: 0 Render date: 2024-04-19T03:35:18.255Z Has data issue: false hasContentIssue false
  • English
  • Français

Magnetic X-Ray Circular Dichroism in Spin-Polarized Photoelectron Diffraction

Published online by Cambridge University Press:  15 February 2011

G. D. Waddill ,
J. G. Tobin ,
X. Guo  and
S. Y. Tong
G. D. Waddill
Affiliation:
Lawrence Livermore National Laboratory, Chemistry and Materials Science Department, P.O. Box 808, L-357, Livermore, CA 94550 ° USA
J. G. Tobin
Affiliation:
Lawrence Livermore National Laboratory, Chemistry and Materials Science Department, P.O. Box 808, L-357, Livermore, CA 94550 ° USA
X. Guo
Affiliation:
University of Wisconsin-Milwaukee, Laboratory for Surface Studies and Department of Physics, Milwaukee, MI 53201 • USA
S. Y. Tong
Affiliation:
University of Wisconsin-Milwaukee, Laboratory for Surface Studies and Department of Physics, Milwaukee, MI 53201 • USA
Get access

Abstract

The first structural determination with spin-polarized, energy-dependent photoelectron diffraction using circularly-polarized x-rays is reported for Fe films on Cu(001). Circularly-polarized x-rays produce spin-polarized photoelectrons from the Fe 2p doublet, and intensity asymmetries in the 2p3/2 level are observed. Fully spin-specific multiple scattering calculations reproduce the experimentally-determined energy and angular dependences. A new analytical procedure which focuses upon intensity variations due to spin-dependent diffraction is introduced. A sensitivity to local geometric and magnetic structure is demonstrated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 375: Symposia AA – Applications of Synchrotron Radiation Techniques to Materials Science , 1994 , 101
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Parkin, S.S.P., Phys. Rev. Lett. 71, 1641 (1993).Google Scholar
2. Gurney, B.P., Speriosu, V.S., Nozieres, J.P., Lefakis, H.F., Wilhoit, D.R., and Need, D.U., Phys. Rev. Lett. 71, 4023 (1993).Google Scholar
3. Tobin, J.G., Waddill, G.D., Li, Hua, and Tong, S.Y., Phys. Rev. Lett. 7, 4150 (1993).Google Scholar
4. Tobin, J.G., Waddill, G.D., and Pappas, D.P., Phys. Rev. Lett. 68, 3642 (1992).Google Scholar
5. Schütz, G., et. al., Phys. Rev. Lett. 62, 2620 (1989).Google Scholar
6. Zhang, F.Z., et al., Bulletin APS 39, 904 (1994), R27.4; B. Sinkovic and C.S. Fadley, Phys. Rev. B 31, 4665 (1985); B. Sinkovic, et al., Phys. Rev. Lett. 55, 1227 (1985); B. Hermsmeier, et. al., Phys. Rev. Lett. 62, 478 (1989).Google Scholar
7. Johnson, M.T., Starnberg, H.I., and Hughes, H.P., J. Phys. C2M, 4385 (1987).Google Scholar
8. Tobin, J.G., Wagner, M.K., Guo, X.Q., and Tong, S.Y., Mat. Res. Soc. Symp. Proc. 208, 283 (1991).Google Scholar
9. Waddill, G.D., Tobin, J.G., Guo, X., and Tong, S.Y., Phys. Rev. Lett. B 50, 6774 (1994).Google Scholar