Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-25T01:13:13.073Z Has data issue: false hasContentIssue false
  • English
  • Français

Mechanics of multi walled Carbon nanotubes probed by AFM

Published online by Cambridge University Press:  21 March 2011

S. Decossas ,
L. Patrone ,
F. Comin  and
J. Chevrier
S. Decossas
Affiliation:
ESRF, BP 220, F38043 Grenoble Cedex FRANCE
L. Patrone
Affiliation:
SCM, CEA/Saclay, 91191 Gif-sur-Yvette cedex, FRANCE
F. Comin
Affiliation:
ESRF, BP 220, F38043 Grenoble Cedex FRANCE
J. Chevrier
Affiliation:
ESRF, BP 220, F38043 Grenoble Cedex FRANCE LEPES-CNRS, BP 166, 38042 Grenoble Cedex 9, FRANCE Université Joseph Fourier (UJF), Grenoble, FRANCE
Get access

Abstract

Using the AFM tip, nanotubes are caught on a raw sample then deposited on a clean surface with an absolute precision better than 500nm. A nanostructured surface made of smooth Germanium dots on flat silicon was used as deposition sample. Nanotube mechanics is probed by AFM tip induced displacement. Nanotubes are shown to be blocked by Ge dots: it is impossible to induce a controlled displacement of the nanotube over a Ge dot when it is pushed against the dot. Elastic energy due to the bending of the nanotube is at the root of that behavior.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 675: Symposium W – Nanotubes, Fullerenes, Nanostructured and Disordered Carbon , 2001 , W4.2.1
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Iijima, S., Nature (London) 354, 56 (1991)Google Scholar
[2] Collins, P.G., Bando, H. and Zettl, A., Nanotechnology 9, 153 (1998)Google Scholar
[3] Dai, H., Franklin, N. and Han, J., Appl. Phys. Lett. 73, 1508 (1998)Google Scholar
[4] Yu, M-F., Files, B.S., Arepalli, S. and Ruoff, R.S., Phys. Rev. Lett. 84, 5552 (2000)Google Scholar
[5] Hertel, T., Martel, R. and Avouris, P., J. Phys. Chem. B 102, 910 (1998)Google Scholar
[6] Tombler, T.W., Zhou, C., Alexeyev, L., Kong, J., Dai, H., Liu, L., Jayanthi, C.S., Tang, M. and Wu, S-H, Nature 405, 769 (2000)Google Scholar
[7] Decossas, S., Patrone, L., Bonnot, A. M., Comin, F., Derivaz, M., Barski, A., and Chevrier, J., submitted to Phys. Rev. Lett. Google Scholar
[8] Decossas, S., Patrone, L., Guillemot, C., Comin, F., and Chevrier, J., submitted to Tribo. Lett. Google Scholar
[9] Bonnot, A.M., Séméria, M.N., Boronat, J.F., Fournier, T. and Pontonnier, L., Diamond and Related Materials 9 (2000) 852–855 Google Scholar
[10] Digital Instrument, Inc., 6780 Cortone Drive, Santa Barbara, CA 93117Google Scholar
[11] Barski, A., Derivaz, M., Rouvière, J.L. and Buttard, D., Appl. Phys. Lett. 77, 3541 (2000)Google Scholar
[12] Decossas, S., Cappello, G., Poignant, G., Patrone, L., Bonnot, A.M., Comin, F. and Chevrier, J., Europhys. Lett., 53 (6), pp. 742–748 (2001)Google Scholar
[13] Landau, L.D. and Lifschitz, E.M., Course of theoretical physics Theory of elasticity Vol. 7, Pergamon Press Oxford (1986)Google Scholar
[14] I = π(D2 − D1)4 / 64 where D2 and D1 are respectively the external and internal diameter of the CNT estimated from TEM measurement to be around 25nm and 10nm. We used E = 1TPa and R0 = ∞. R, the local radius of curvature of the bent CNT is chosen to be constant and equal to 675 nm (that is the radius of curvature of a Ge dot). The distance z along which the nanotube is bent is calculated to be around 515 nm.Google Scholar
[15] U = Flat × d. Flat is the lateral force and d is the displacement of the tip (equal to 50nm, the height of the dot).Google Scholar