Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-19T22:05:02.909Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparison of Common Segmentation Techniques Applied to Transmission Electron Microscopy Images

Published online by Cambridge University Press:  01 February 2011

Thomas Sadowski ,
Christine C. Broadbridge  and
John Daponte
Thomas Sadowski
Affiliation:
tommy91779@hotmail.com, Southernc Connecticut State University, Physics and Computer Science, 501 Crescent St, New Haven, CT, 06515, United States, (203) 392-5200
Christine C. Broadbridge
Affiliation:
broadbridge@southernct.edu, Southern Connecticut State University, Physics, 501 Crescent Street, New Haven, CT, 06515, United States
John Daponte
Affiliation:
dapontej1@southernct.edu, Southern Connecticut State University, Computer Science, 501 Crescent Street, New Haven, CT, 06515, United States
Get access

Abstract

Nanoparticles are of interest in many applications since their decreased size may give them properties that are very different from bulk material. Often nanoparticle properties such as size (diameter) and size distribution are evaluated using transmission electron microscopy (TEM). These parameters, size and size distribution, can be more easily obtained from digitized TEM images by mapping particle signal to black and background pixel to white in a process known as thresholding then performing an algorithm known as a particle analysis. The goal of this study was to compare the ability of several popular thresholding algorithms to segment TEM images. Performance of the thresholding algorithms was evaluated through qualitative and quantitative measures. Results show that the choice of a thresholding algorithm will strongly affect the results obtained from particle analysis.

Keywords

transmission electron microscopy (TEM)structuralparticulate
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 982: Symposium KK – Electron Microscopy Across Hard and Soft Materials , 2006 , 0982-KK07-04
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Fisker, R., Carstensen, J.M., Hanson, M.F., Bodker, F. and Morup, S., J. Nanopart. Res. 2, 267 (2000).CrossRefGoogle Scholar

2 Flores, A.B., Robles, L.A., Arias, M.O., and Ascencio, J.A., Micron 34, 109 (2003).CrossRefGoogle Scholar

3 Woehrle, G., Hutchison, J., Ozkar, S., and Finke, R., J. Chem. 30, 1 (2006).Google Scholar

4 Shaoo, P.K., Soltani, S., and Wong, A.K.C., Comp. Vis., Graph., Im. Proc. 41, 233 (1988)CrossRefGoogle Scholar

5 Sezgin, M. and Sankur, B., J. Elec. Imag. 13, 1, 146 (2004)Google Scholar

6 http://nvl.nist.gov/ Google Scholar

7 http://rsb.info.nih.gov/ij/ Google Scholar

8 http://www.mathworks.com/ Google Scholar