Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-25T23:43:20.544Z Has data issue: false hasContentIssue false

Improved Autoadhesion Measurement Method for Micromachined Polysilicon Beams

Published online by Cambridge University Press:  15 February 2011

Maarten P. de Boer
Affiliation:
Surface and Interface Science, Dept. 1114, Mail Stop 1413, Sandia National Laboratories, Albuquerque, NM 87185(mpdebo@sandia.gov)
Terry A. Michalske
Affiliation:
Surface and Interface Science, Dept. 1114, Mail Stop 1413, Sandia National Laboratories, Albuquerque, NM 87185(mpdebo@sandia.gov)
Get access

Abstract

We have measured autoadhesion (e.g. stiction) of individual polysilicon beams by interferometric optical microscopy. Untreated cantilever beams were dried from water in air, while treated beams were coated with a hydrophobic molecular coating of octadecyltrichlorosilane (ODTS). Adhesion values obtained for beams adhered to the substrate over a long length (large d) are independent of beam length with values of 16.7 and 4.4 mJ/m2 for untreated and treated samples respectively. These values can be understood in terms of differences in surface chemistry and polysilicon roughness. Using the shortest length beam which remains attached to the substrate, adhesion values were 280 and 16 mJ/m2 respectively. These higher values may be a result of capillarity effects. We recommend that measurements be made on beams in which d is large, in contrast to the current practice of noting the shortest beam adhered.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Mastrangelo, C. H. and Tang, W. C., Semiconductor Sensors, Sze, S. M., Ed., 70 (John Wiley & Sons, New York, 1994).Google Scholar
2. Alley, R. L., Cuan, G. J., Howe, R. T. and Komvopoulos, K., Proc. IEEE Solid-State Sensor & Actuator Workshop (Hilton Head), 202 (1992).Google Scholar
3. Alley, R, L., Mai, P., Komvopoulos, K. and Howe, R. T., Proc. Int. Conf. Solid-State Sensors & Actuators (Transducers '93), 288 (1993).Google Scholar
4. Mastrangelo, C. H. and Hsu, C. H., Proc. IEEE Solid-State Sensor & Actuator Workshop (Hilton Head), 208 (1992).Google Scholar
5. Mastrangelo, C. H. and Hsu, C. H., J. MEMS 2 (1), 33 (1993).Google Scholar
6. Mastrangelo, C. H. and Hsu, C. H., J. MEMS 2 (1), 44 (1993).Google Scholar
7. Abe, T., Messner, W. C. and Reed, M. L., J. MEMS, (1995).Google Scholar
8. Legtenberg, R., Elders, J. and Elwenspoek, M., Proc. Int. Conf. Solid-State Sensors & Actuators (Transducers '93), 298 (1993).Google Scholar
9. Houston, M. R., Maboudian, R. and Howe, R. T., Proc. Int. Conf. Solid-State Sensors & Actuators (Transducers '95), 210 (1995).Google Scholar
10. Yee, Y., Chun, K. and Lee, J. D., Proc. Int. Conf. Solid-State Sensors & Actuators (Transducers '95), 206 (1995).Google Scholar
11. Mulhern, G. T., Soane, D. S. and Howe, R. T., Proc. Int. Conf. Solid-State Sensors & Actuators (Transducers '93), 296 (1993).Google Scholar
12. Houston, M. R., Howe, R. T., Komvopoulos, K. and Maboudian, R., Mater. Res. Soc. Proc. 383, 391 (1995).Google Scholar
13. Houston, M. R., Maboudian, R. and Howe, R. T., Proc. IEEE Solid-State Sensor & Actuator Workshop (Hilton Head), 42 (1996).Google Scholar
14. Man, P. F., Gogoi, B. P. and Mastrangelo, C. H., IEEE MEMS (San Diego), 55 (1996).Google Scholar
15. Ewalds, H. L. and Wanhill, R. J. H., Fracture Mechanics, 82–84 (Edward Arnold and Delftse Uitgevers Maatschapij, London, 1991).Google Scholar
16. Johnson, K. L., Kendall, K. and Roberts, A. D., Proc. Roy. Soc. Lond. A. 324, 301 (1971).Google Scholar
17. Derjaguin, B. V., Muller, V. M. and Toporov, Y. P., J. Colloid Interface Sci. 53(2), 314 (1975).Google Scholar
18. Israelachvili, J. N., J. Colloid Interface Sci. 44, 259 (1973).Google Scholar
19. Horn, R. G., Israelachvili, J. N. and Pribac, F., J. Colloid Interface Sci. 115 (2), 480 (1987).Google Scholar
20. de Boer, M. P. and Michalske, T. A., J. Appl. Phys., (to be submitted).Google Scholar
21. Michalske, T. A. and Fuller, E. R., J. Am. Ceram. Soc. 68, 586 (1985).Google Scholar
22. Houston, M. R., Howe, R. T. and Maboudian, R., J. Appl. Phys., (submitted).Google Scholar