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Indium Composition Variation in Nominally Uniform InGaN Layers Discovered by Aberration-Corrected Z-contrast STEM

Published online by Cambridge University Press:  08 April 2017

A Yankovich ,
A Kvit ,
X Li ,
F Zhang ,
V Avrutin ,
H Liu ,
N Izyumskaya ,
Ü Özgür ,
H Morkoc  and
P Voyles
A Yankovich
Affiliation:
University of Wisconsin, Madison
A Kvit
Affiliation:
University of Wisconsin, Madison
X Li
Affiliation:
Virginia Commonwealth University
F Zhang
Affiliation:
Virginia Commonwealth University
V Avrutin
Affiliation:
Virginia Commonwealth University
H Liu
Affiliation:
Virginia Commonwealth University
N Izyumskaya
Affiliation:
Virginia Commonwealth University
Ü Özgür
Affiliation:
Virginia Commonwealth University
H Morkoc
Affiliation:
Virginia Commonwealth University
P Voyles
Affiliation:
University of Wisconsin, Madison

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1386 - 1387
Copyright
Copyright © Microscopy Society of America 2011