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Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM

Published online by Cambridge University Press:  25 July 2016

M. Simson ,
R.E. Dunin-Borkowski ,
R. Hartmann ,
M. Huth ,
S. Ihle ,
L. Jones ,
Y. Kondo ,
V. Migunov ,
P.D. Nellist  and
R. Ritz
...Show all authors
M. Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
R.E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, FZJ, 52425 Jülich, Germany
R. Hartmann
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
M. Huth
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
S. Ihle
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
L. Jones
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Y. Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
V. Migunov
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
P.D. Nellist
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
R. Ritz
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
R. Sagawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
J. Schmidt
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
L. Strüder
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
H. Yang
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 512 - 513
Copyright
© Microscopy Society of America 2016 

References

[1] Ryll, H, et al, Microscopy and Microanalysis 19 (2013). p. 1160–1161.CrossRefGoogle Scholar
[2] Migunov, V, et al, Scientific Reports 5 (2015) 14516.CrossRefGoogle Scholar
[3] Rodenburg, JM, McCallum, BC & Nellist, PD Ultramicroscopy 48 (1993). p. 304–314.CrossRefGoogle Scholar
[4] Batenburg, KJ & Sijbers, J IEEE Trans. Image Process 20 (2011). p. 2542–2553.CrossRefGoogle Scholar
[5] The authors acknowledge Xiaodong Zhuge, K. Joost Batenburg and Lothar Houben for their contributions to the tomography measurement.Google Scholar