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Analysis of Amorphous-to-crystalline Germanium Stack with Cs-corrected Analytical STEM

Published online by Cambridge University Press:  04 August 2017

Dalaver H. Anjum ,
Kwang H. Lee ,
Guangnan Zhou ,
Qiang Zhang ,
Nini Wei ,
Guangrui (Maggie) Xia ,
Chuan S. Tan  and
Xixiang Zhang
Dalaver H. Anjum
Affiliation:
Imaging and Characterization Lab, King Abdullah University of Science & Technology (KAUST), Saudi Arabia
Kwang H. Lee
Affiliation:
Singapore-MIT Alliance for Research and Technology, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
Guangnan Zhou
Affiliation:
Department of Materials Science & Engineering, University of British Columbia, Canada
Qiang Zhang
Affiliation:
Materials Science & Engineering Program, King Abdullah University of Science & Technology (KAUST), Saudi Arabia
Nini Wei
Affiliation:
Imaging and Characterization Lab, King Abdullah University of Science & Technology (KAUST), Saudi Arabia
Guangrui (Maggie) Xia
Affiliation:
Department of Materials Science & Engineering, University of British Columbia, Canada
Chuan S. Tan
Affiliation:
Singapore-MIT Alliance for Research and Technology, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
Xixiang Zhang
Affiliation:
Materials Science & Engineering Program, King Abdullah University of Science & Technology (KAUST), Saudi Arabia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1514 - 1515
Copyright
© Microscopy Society of America 2017 

References

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[3] Goldschmidt, D. Thin Solid Films 90 1982). p. 139.Google Scholar