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Angle-Resolved Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  30 July 2020

Tracy Lovejoy ,
Benjamin Plotkin-Swing ,
Niklas Dellby ,
Chris Meyer ,
Andreas Mittelberger ,
Alberto Eljarrat ,
Benedikt Haas ,
Christoph Koch  and
Ondrej Krivanek
Tracy Lovejoy
Affiliation:
Nion Co., Kirkland, Washington, United States
Benjamin Plotkin-Swing
Affiliation:
Nion Co., Kirkland, Washington, United States
Niklas Dellby
Affiliation:
Nion Co., Kirkland, Washington, United States
Chris Meyer
Affiliation:
Nion Co., Kirkland, Washington, United States
Andreas Mittelberger
Affiliation:
Nion Co., Kirkland, Washington, United States
Alberto Eljarrat
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Benedikt Haas
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Christoph Koch
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Ondrej Krivanek
Affiliation:
Nion Co., Kirkland, Washington, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 964 - 965
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Copyright
Copyright © Microscopy Society of America 2020

References

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