Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Search

Refine search

Refine search

Access:
Content type:
Publication date:
Apply   From and To filters
Subject: Show more
Journals Show more
Publishers: Show more
Societies Show more
Series: Show more
Collections: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×

11 results

  • Moving atomic-resolution imaging into the age of deep data

  • Oleg S. Ovchinnikov, S. Jesse, A. Belianinov, S. T. Pantelides, S.V. Kalinin, A.Y. Borisevich
  • Journal:
    / Volume 21 / Issue S3 / August 2015
    Published online by Cambridge University Press:
    23 September 2015, pp. 1607-1608
    Print publication:
    August 2015
    • Article
      • You have access
    • PDF
    • Export citation

  • Atomic Structure of Surface Dielectric Dead Layer in BiFeO3 Thin Film

  • Y.-M. Kim, A.N. Morozovska, E.A. Eliseev, A.R. Lupini, Y.-H. Chu, P. Yu, R. Ramesh, S.J. Pennycook, S.V. Kalinin, A.Y. Borisevich
  • Journal:
    / Volume 19 / Issue S2 / August 2013
    Published online by Cambridge University Press:
    09 October 2013, pp. 1928-1929
    Print publication:
    August 2013
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Characterizing the Two- and Three-Dimensional Resolution of an Improved Aberration-Corrected STEM

  • A.R. Lupini, A.Y. Borisevich, J.C. Idrobo, H.M. Christen, M. Biegalski, S.J. Pennycook
  • Journal:
    / Volume 15 / Issue 5 / October 2009
    Published online by Cambridge University Press:
    16 September 2009, pp. 441-453
    Print publication:
    October 2009

  • The successful development of third-order aberration correctors in transmission electron microscopy has seen aberration-corrected electron microscopes evolve from specialist projects, custom built at a small number of sites to common instruments in many modern laboratories. Here we describe some initial results illustrating the two- and three-dimensional (3D) performance of an aberration-corrected scanning transmission electron microscope with a prototype improved aberration corrector designed to also minimize fifth-order aberrations and a new, higher brightness gun. We show that atomic columns separated by 0.63 Å can be resolved and demonstrate detection of single dopant atoms with 3D sensitivity.