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47 results

Page 1 of 3

  • Parallelizing py4DSTEM: 4D-STEM Analysis from Hours to Minutes

  • Alexander Rakowski, Benjamin H Savitzky, Steven E Zeltmann, Matthew Henderson, Colin Ophus
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 426-427
    Print publication:
    August 2022
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  • Accuracy, Reproducibility, and Calibration in 4D-STEM

  • Benjamin H. Savitzky, Colin Ophus
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 470-472
    Print publication:
    August 2022
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  • Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching

  • Colin Ophus, Steven E. Zeltmann, Alexandra Bruefach, Alexander Rakowski, Benjamin H. Savitzky, Andrew M. Minor, Mary C. Scott
  • Journal:
    / Volume 28 / Issue 2 / April 2022
    Published online by Cambridge University Press:
    09 February 2022, pp. 390-403
    Print publication:
    April 2022
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  • Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is crucial, but the information extracted from the diffraction condition probed by an electron beam is often incomplete. We have developed an automated crystal orientation mapping (ACOM) procedure which uses a converged electron probe to collect diffraction patterns from multiple locations across a complex sample. We provide an algorithm to determine the orientation of each diffraction pattern based on a fast sparse correlation method. We demonstrate the speed and accuracy of our method by indexing diffraction patterns generated using both kinematical and dynamical simulations. We have also measured orientation maps from an experimental dataset consisting of a complex polycrystalline twisted helical AuAgPd nanowire. From these maps we identify twin planes between adjacent grains, which may be responsible for the twisted helical structure. All of our methods are made freely available as open source code, including tutorials which can be easily adapted to perform ACOM measurements on diffraction pattern datasets.

Page 1 of 3