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Recent Developments in Laboratory X-ray Microanalytical Techniques for Electronic Structure, Chemical Composition, and Microstructure of Metals and Materials
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- Journal:
- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, p. 516
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- August 2020
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Innovative μXRF Mapping of Ore Samples: A Comparison of Novel Synchrotron- and Lab-Based Technology
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- Journal:
- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 274-275
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- August 2019
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Next-generation X-ray Optics for High Resolution Applications
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- Journal:
- / Volume 24 / Issue S2 / August 2018
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- 10 August 2018, pp. 300-301
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- August 2018
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Mapping Subsurface Composition with Attogram Sensitivity using Micro-XRF
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- Journal:
- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1058-1059
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- August 2018
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A New Approach to Microns-Resolution Trace Element and Mineralogy Mapping at PPM Sensitivity for Digital Rock and Geological Research
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- Journal:
- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2176-2177
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- July 2017
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Development of an X-ray Based Spectroscopy MicroXRF System with LA-ICP-MS Capabilities: Trace-Level Microns-scale Mapping and Femtogram Detection Sensitivity
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- Journal:
- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 44-45
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- July 2017
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Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation
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- Journal:
- / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 118-119
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- July 2016
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Standardless Quantification at Trace Elemental (PPM) Levels Using a Novel Attachment within an Electron Microscope and Microprobe
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- Journal:
- / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 436-437
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- July 2016
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