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18 results

  • Simulation-Trained Machine Learning Models for Lorentz Microscopy

  • Arthur R. C. McCray, Amanda K. Petford-Long, Charudatta Phatak
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 2980-2982
    Print publication:
    August 2022
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  • In-situ Electron Holography Study of Grain Boundaries in Cerium Oxide

  • Xin Xu, Sossina Haile, Charudatta Phatak
  • Journal:
    / Volume 24 / Issue S1 / August 2018
    Published online by Cambridge University Press:
    01 August 2018, pp. 1466-1467
    Print publication:
    August 2018
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  • Topological Defects and Interaction of Electron Waves and Localized Magnetic Charge

  • Frank Barrows, Amanda Petford-Long, Charudatta Phatak
  • Journal:
    / Volume 24 / Issue S1 / August 2018
    Published online by Cambridge University Press:
    01 August 2018, pp. 940-941
    Print publication:
    August 2018
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  • Three dimensional magnetic field reconstruction of artificial Skyrmion heterostructures

  • Sheng Zhang, Amanda Petford-Long, Charudatta Phatak
  • Journal:
    / Volume 21 / Issue S3 / August 2015
    Published online by Cambridge University Press:
    23 September 2015, pp. 1959-1960
    Print publication:
    August 2015
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  • Towards Multiresolution Phase Retrieval using Electron Ptychography

  • Charudatta Phatak, Youssef Nashed, Tom Peterka
  • Journal:
    / Volume 21 / Issue S3 / August 2015
    Published online by Cambridge University Press:
    23 September 2015, pp. 2151-2152
    Print publication:
    August 2015
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  • Dielectric behavior related to TiOx phase change to TiO2 in TiOx/Al2O3 nanolaminate thin films

  • Geunhee Lee, Ram S. Katiyar, Bo-Kuai Lai, Charudatta Phatak, Orlando Auciello
  • Journal:
    MRS Communications / Volume 4 / Issue 2 / June 2014
    Published online by Cambridge University Press:
    13 May 2014, pp. 67-72
    Print publication:
    June 2014

  • We previously demonstrated that TiOx/Al2O3 nanolaminates (TAO NL) exhibit abnormally high-dielectric constant k (800–1000), due to Maxwell–Wagner polarization, via charge accumulation at insulating Al2O3/semiconducting TiOx interfaces. Here, we report TAO NL dielectric properties related to TiOx phase change in TiOx (0.9 nm)/Al2O3 (0.1 nm) NL. High-resolution transmission electron microscopy shows amorphous TiOx phase change to crystalline anatase TiO2 due to free-energy minimization. The phase change induce reduction in leakage current and dielectric loss (J = 10−2 to 10−4 A/cm2, tan δ = 10 to 10−1), still with k ~ 600 up to MHz, compared to amorphous TAO NLs.

  • Is a Cs Corrector Necessary for Lorentz Vector Field Tomography?

  • Charudatta Phatak, Marc De Graef
  • Journal:
    / Volume 15 / Issue 6 / November 2007
    Published online by Cambridge University Press:
    14 March 2018, pp. 24-27
    Print publication:
    November 2007
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  • Magnetic recording media based on patterned shapes are promising for applications in high density data storage. Optimizing the design of the patterned arrays requires characterization of the particle shapes and their relative locations, and the magnetostatic interactions between particles. To achieve this, one must determine the three dimensional (3D) magnetic induction in and around the nano magnets. We propose a method based on Vector Field Electron Tomography coupled with phase reconstructed Lorentz Microscopy to determine the 3D magnetic induction. This method can be broken down into two steps 1) Determination of the magnetic phase shift of the electron wave using phase reconstructed Lorentz microscopy and 2) Reconstruction (in 3D) of the magnetic induction in and around the magnetic particle using Vector Field Electron Tomography (VFET). First, we will discuss the theoretical development of VFET and then the importance of spherical aberration (Cs) correctors for Lorentz microscopy.