18 results
High Resolution Electron Microscopy Characterization of (La0.5Sr0.5)2CoC4 Thin Film Cathode Materials
-
- Journal:
- / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1912-1913
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Absorption Corrections for a Four-Quadrant SuperX EDS Detector
-
- Journal:
- / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 100-101
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Composition Analysis on the Precipitates in the NiTiHf and NiPdTiHf Alloys
-
- Journal:
- / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1518-1519
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
TEM - Now We Can Image and Identify Single Atoms; What's Next?
-
- Journal:
- / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1732-1733
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
DIVISIONS I, III / COMMISSIONS 4, 7, 8, 16, 20 / WORKING GROUP ON NATURAL PLANETARY SATELLITES
-
- Journal:
- Proceedings of the International Astronomical Union / Volume 7 / Issue T28A / December 2011
- Published online by Cambridge University Press:
- 04 April 2012, pp. 56-59
- Print publication:
- December 2011
-
- Article
-
- You have access
- Export citation
Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction
-
- Journal:
- / Volume 12 / Issue 6 / December 2006
- Published online by Cambridge University Press:
- 11 October 2006, pp. 515-526
- Print publication:
- December 2006
-
- Article
- Export citation
Improvements of Elemental Mapping via X-ray Spectrum Imaging Combined with Principal Component Analysis and Zero-Peak Deconvolution
-
- Journal:
- / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1040-1041
- Print publication:
- August 2004
-
- Article
- Export citation
Accurate Determination of Grain Boundary Coverages of Segregating Elements by STEM X-ray Mapping Combined with the ζ-Factor Method
-
- Journal:
- / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 21 July 2003, pp. 668-669
- Print publication:
- August 2003
-
- Article
-
- You have access
- Export citation
Key Events in the History of Electron Microscopy
-
- Journal:
- / Volume 9 / Issue 2 / April 2003
- Published online by Cambridge University Press:
- 14 March 2003, pp. 96-138
- Print publication:
- April 2003
-
- Article
- Export citation
Irradiation-Induced Development of Nanoscale Features in Steel: Complementary 3D-APFIM and FEG-STEM Characterization
-
- Journal:
- / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 292-293
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation
Energy Loss Fine Structure Studies of Temper-Embrittled Lowalloy Steel
-
- Journal:
- / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 300-301
- Print publication:
- August 2001
-
- Article
- Export citation
Future Direction of High-Resolution X-Ray Microanalysis in the AEM
-
- Journal:
- / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 212-213
- Print publication:
- August 2001
-
- Article
- Export citation
Analysis of the Structure of Bulk Metallic Glasses Using EXELFST
-
- Journal:
- / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 194-195
- Print publication:
- August 2000
-
- Article
- Export citation
The Determination of Carbide Types in Thin-Film Specimens of Low Alloy Steels.
-
- Journal:
- / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 348-349
- Print publication:
- August 2000
-
- Article
- Export citation
Teaching Microscopy and Microscope Theory Based on Remote Instrument Access and Instrument Automation
-
- Journal:
- / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1162-1163
- Print publication:
- August 2000
-
- Article
- Export citation
Analysis of Extended Energy-Loss Fine Structure of Nanometerscale Clusters
-
- Journal:
- / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 708-709
- Print publication:
- August 1999
-
- Article
- Export citation
Low-magnification Quantitative X-ray Mapping of Grain-boundary Segregation in Aluminum–4 wt.% Copper by Analytical Electron Microscopy
-
- Journal:
- / Volume 5 / Issue 4 / July 1999
- Published online by Cambridge University Press:
- 29 January 2003, pp. 254-266
- Print publication:
- July 1999
-
- Article
- Export citation
Quantification of Cu Segregation to Grain Boundaries in an Al - 4 Wt.% Cu Thin Film Using High Resolution X-Ray Mapping
-
- Journal:
- / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 537-538
- Print publication:
- August 1997
-
- Article
- Export citation