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16 results

  • Probing Device-relevant Defects in van der Waals Layered Materials

  • Danielle Reifsnyder Hickey
  • Journal:
    / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, pp. 1618-1619
    Print publication:
    August 2020
    • Article
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  • Atomic Structure of W1-xMoxS2 Alloys and Heterostructures

  • Danielle Reifsnyder Hickey, Saiphaneendra Bachu, Mikhail Chubarov, Joan M. Redwing, Nasim Alem
  • Journal:
    / Volume 24 / Issue S1 / August 2018
    Published online by Cambridge University Press:
    01 August 2018, pp. 1628-1629
    Print publication:
    August 2018
    • Article
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  • Cross-sectional STEM Imaging and Spectroscopy of Devices with Embedded 2D Materials

  • Ryan J. Wu, Danielle Reifsnyder Hickey, K. Andre Mkhoyan
  • Journal:
    / Volume 23 / Issue S1 / July 2017
    Published online by Cambridge University Press:
    04 August 2017, pp. 1440-1441
    Print publication:
    July 2017
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