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In this paper, we present a reanalysis of the silicon He-$\mathrm{\alpha}$ X-ray spectrum emission in Fujioka et al.’s 2009 photoionization experiment. The computations were performed with our radiative-collisional code, RCF. The central ingredients of our computations are accurate atomic data, inclusion of satellite lines from doubly excited states and accounting for the reabsorption of the emitted photons on their way to the spectrometer. With all these elements included, the simulated spectrum turns out to be in good agreement with the experimental spectrum.

An ‘effective Feynman diagram’ technique is introduced to obtain relations between the cross-sections of various atomic processes. In this paper the technique is used to obtain a simple relation between the cross-sections of electron impact excitation and resonant photon absorption. The method is important because calculations of complicated atomic wavefunctions are eliminated.

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Emission mechanism for the silicon He-α lines in a photoionization experiment

Determination of atomic cross-sections for electron impact excitation using effective Feynman diagrams and Einstein coefficients

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Emission mechanism for the silicon He-α lines in a photoionization experiment

Determination of atomic cross-sections for electron impact excitation using effective Feynman diagrams and Einstein coefficients