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70 results

Page 1 of 4

  • Development of a Stable Low Temperature Sample Holder for the Side-Entry Transmission Electron Microscope

  • Alexander Reifsnyder, David W. McComb
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, p. 2476
    Print publication:
    August 2022
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  • STEM-EELS Exploration of Beam-Sensitive Perovskite Nanocrystals

  • Brittany Ford, David W. McComb, Michael Brennan, Tod Grusenmeyer
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 2160-2161
    Print publication:
    August 2022
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  • Exploring Electron Energy-Loss Spectroscopy for Characterization of Structured Fluids

  • Brittany Ford, David W. McComb
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 2150-2151
    Print publication:
    August 2022
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  • MMP20-ablated Induced Aberrant Mineralization in Early Secretory Enamel

  • Ya-Hsiang Hsu, Amanda Trout, John D. Bartlett, Charles E. Smith, David W. McComb
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 1356-1358
    Print publication:
    August 2022
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  • Crystal Structure Determination of Gramicidin by Microcrystal Electron Diffraction

  • Nicole Hoefer, David W. McComb
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 1080-1082
    Print publication:
    August 2022
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  • Cryo-electron microscopy instrumentation and techniques for life sciences and materials science

  • Robert E.A. Williams, David W. McComb, Sriram Subramaniam
  • Journal:
    MRS Bulletin / Volume 44 / Issue 12 / December 2019
    Published online by Cambridge University Press:
    10 December 2019, pp. 929-934
    Print publication:
    December 2019

  • In this article, we review some of the recent developments in instrumentation and methods that have led to the rise of cryo-electron microscopy (cryo-EM) in the life sciences community, and consider how researchers in the materials community might benefit from these advances. Transmission electron microscopy (TEM) is compared with scanning transmission electron microscopy (STEM) for cryogenic imaging in both biological and materials science applications. We discuss the developments in detector technologies that have in part powered the development of cryo-EM and anticipate exciting areas for productive overlap between life science and materials science cryo-EM applications.

  • Cryogenic transmission electron microscopy for materials research

  • David W. McComb, Jeffrey Lengyel, C. Barry Carter
  • Journal:
    MRS Bulletin / Volume 44 / Issue 12 / December 2019
    Published online by Cambridge University Press:
    10 December 2019, pp. 924-928
    Print publication:
    December 2019
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  • Cryogenic transmission electron microscopy is simply transmission electron microscopy conducted on specimens that are cooled in the microscope. The target temperature of the specimen might range from just below ambient temperature to less than 4 K. In general, as the temperature decreases, cost increases, especially below –77°C when liquid He is required. We have two reasons for wanting to cool the specimen—improving stability of the material or observing a material whose properties change at lower temperatures. Both types of study have a long history. The cause of excitement in this field today is that we have a perfect storm of research activity—electron microscopes are almost stable with minimal drift (we can correct what drift there is), we can prepare specimens from the bulk or build them up, we have spherical-aberration-corrected lenses and monochromated beams, we have direct-electron-detector cameras, and computers are becoming powerful enough to handle all the data we produce.

  • Imaging and analysis of low atomic number materials in the STEM

  • Jessica A. Alexander, Michael Chilcote, Ezekiel Johnston-Halperin, David W. McComb
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 1734-1735
    Print publication:
    August 2019
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  • Nanoscale Quantification of Jahn-Teller Distortion in LaMnO3

  • Binbin Wang, Bryan D. Esser, Nuria Bagués, Jiaqiang Yan, David W. McComb
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 80-81
    Print publication:
    August 2019
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  • Remote Operation: The Future of Education and Research in Electron Microscopy

  • Daniel E. Huber, Frank J. Scheltens, Robert E.A. Williams, David W. McComb
  • Journal:
    / Volume 26 / Issue 5 / September 2018
    Published online by Cambridge University Press:
    11 September 2018, pp. 26-33
    Print publication:
    September 2018
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  • The OSU-FEI Electron Microscopy Collaboratory multiplies the number of individuals who can experience hands-on advanced microscopy techniques. The microscopy classroom allows up to 33 attendees to operate, individually and in real time, electron microscopes as if they were sitting in front of the actual instruments. The communications link, a fast backbone augmented by Internet2, allows various microscopes to be operated from the classroom or by collaborators in another city. This system transforms the training of new users from a one-person-at-a-time session with an expert operator to a group collaborative activity that can include users from around the world.

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