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Childhood trauma (CT) is associated with an increased risk of mental health disorders; however, it is unknown whether this represents a diagnosis-specific risk factor for specific psychopathology mediated by structural brain changes. Our aim was to explore whether (i) a predictive CT pattern for transdiagnostic psychopathology exists, and whether (ii) CT can differentiate between distinct diagnosis-dependent psychopathology. Furthermore, we aimed to identify the association between CT, psychopathology and brain structure.
Methods
We used multivariate pattern analysis in data from 643 participants of the Personalised Prognostic Tools for Early Psychosis Management study (PRONIA), including healthy controls (HC), recent onset psychosis (ROP), recent onset depression (ROD), and patients clinically at high-risk for psychosis (CHR). Participants completed structured interviews and self-report measures including the Childhood Trauma Questionnaire, SCID diagnostic interview, BDI-II, PANSS, Schizophrenia Proneness Instrument, Structured Interview for Prodromal Symptoms and structural MRI, analyzed by voxel-based morphometry.
Results
(i) Patients and HC could be distinguished by their CT pattern with a reasonable precision [balanced accuracy of 71.2% (sensitivity = 72.1%, specificity = 70.4%, p ≤ 0.001]. (ii) Subdomains ‘emotional neglect’ and ‘emotional abuse’ were most predictive for CHR and ROP, while in ROD ‘physical abuse’ and ‘sexual abuse’ were most important. The CT pattern was significantly associated with the severity of depressive symptoms in ROD, ROP, and CHR, as well as with the PANSS total and negative domain scores in the CHR patients. No associations between group-separating CT patterns and brain structure were found.
Conclusions
These results indicate that CT poses a transdiagnostic risk factor for mental health disorders, possibly related to depressive symptoms. While differences in the quality of CT exposure exist, diagnostic differentiation was not possible suggesting a multi-factorial pathogenesis.
By use of a method of dissection, a formula is derived for the variance in the number of lattice points covered by a rectangle of arbitrary size, lying on a square lattice of unit spacing and inclined to the lattice at an angle of which the tangent is a rational fraction.
The appropriate application of multilayers as x-ray dispersion devices requires that their diffraction characteristics be understood. Conventional models, based on perfect-crystal and mosaic-crystal theories, predict diffraction efficiencies (integral reflection coefficients) significantly larger than values measured experimentally. It has been shown that introduction of surface roughness effects into the model can promote agreement between experimental and theoretical values, while the presence of other types of defects produce changes too small in magnitude to explain the discrepancy. Because it is reasonably well agreed that the resolving power of multilayers is only moderate, compared to the more conventional “crystal” dispersing devices, it is important to be able to predict or measure that parameter in order to assess the usefulness for a particular application. Experimental measurements and theoretical calculations have been carried out on multilayers (almost exclusively tungsten/carbon) prepared to have 2d-spacings from 50 to 140A. The experimental work used both singlecrystal and double-crystal spectrometers; the calculations used the crystal diffraction model, as modified to include surface roughness.
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