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Correlative Microscopy: Elucidating the Mechanisms of SCC in Structural Alloys in PWR Environments
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- Journal:
- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 168-170
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- August 2020
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Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study
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- Journal:
- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 394-395
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- August 2020
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TEM Specimen Preparation Using a Low Energy Ion Beam for Nuclear Metallic Materials
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- Journal:
- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1608-1609
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- August 2019
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Understanding 2D Crystal Vertical Heterostructures at the Atomic Scale Using Advanced Scanning Transmission Electron Microscopy
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- Journal:
- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1714-1715
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- July 2017
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Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy
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- Journal:
- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 214-215
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- July 2017
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Real Time Evolution of the Reduction of Ilmenite in H2: A Correlative In Situ and Ex Situ Study
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- Journal:
- / Volume 22 / Issue S5 / November 2016
- Published online by Cambridge University Press:
- 21 December 2016, pp. 54-55
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- November 2016
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Temperature Programmed Reduction of a PdCu Bimetallic Catalyst via Atmospheric Pressure in situ STEM-EDS and in situ X-Ray Adsorption Analysis
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- Journal:
- / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 214-215
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- July 2016
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In situ Analytical TEM of Ilmenite Reduction in Hydrogen
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- / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 565-566
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- August 2015
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XEDS and EELS in the TEM at Atmospheric Pressure and High Temperature
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- Journal:
- / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 247-248
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- August 2015
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Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices
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- Journal:
- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 107-108
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- August 2015
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