11 results
Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM
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- Journal:
- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 184-185
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- August 2018
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Extracting Thickness and Tilt From 4D-STEM Datasets to Model the Influence on ABF Images
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- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 216-217
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- August 2018
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Structure and Chemistry of Oxide Surface Reconstructions in III-Nitrides Observed using STEM EELS
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- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1444-1445
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- July 2017
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Utilizing High-temperature Atomic-resolution STEM and EELS to Determine Reconstructed Surface Structure of Complex Oxide
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- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1596-1597
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- July 2017
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Compositional Ordering and Polar Nano-Regions: Physical Effects of Sn Alloying in SrTiO3 Thin Films
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- Journal:
- / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1582-1583
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- July 2017
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In-situ-by-Ex-situ:FIB-less Preparation of Bulk Samples on Heating Membranes for Atomic Resolution STEM Imaging
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- Journal:
- / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 774-775
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- July 2016
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Observing Misfit Dislocation Interactions Across Thin Film Oxide Heterostructures
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- Journal:
- / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1506-1507
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- July 2016
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Revealing Unit Cell Level Distortions in Random Oxide Solid Solutions by Scanning Transmission Electron Microscopy and the Projected Pair Distribution Function
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- Journal:
- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1239-1240
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- August 2015
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Origin of Ferroelectricity in Thin Film HfO2 Probed by Revolving STEM and PACBED
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- Journal:
- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 779-780
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- August 2015
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Application of the Projective Standard Deviation to STEM Imaging and Analysis
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- Journal:
- / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 118-119
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- August 2014
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Putting a New Spin on Scanning Transmission Electron Microscopy
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- / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 140-141
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- August 2014
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