36 results
Quantitative Study of Electron Radiation Damage by in Situ Observation of the Phase Transformation from CaCO3 to CaO as a function of the accelerating voltage (20-300 kV)
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- / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1214-1215
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- August 2013
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Contrast Enhancement in Low-kV Zero-loss Filtered Imaging of Frozen-hydrated Biological Specimen
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- / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1234-1235
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- August 2013
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Novel EDS Detector Arrangement Enabling High Solid Angle Detection
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- / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1200-1201
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- July 2012
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Identification of DNA and Single Nanoparticles (Qdots) in Muscle Tissue Sections by Low Energy-Loss Electron Spectroscopic Imaging
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- / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 818-819
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- July 2011
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Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering
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- / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 1074-1075
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- July 2011
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Cryo Imaging at 60 keV and 200 keV at a Cs-Corrected ZEISS Libra 200
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- / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 88-89
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- July 2011
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Reduced Radiation Damage of Protein Embedded in Vitreous Ice at Low Electron Energies
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- / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 122-123
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- July 2011
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Results on 20kV Spectroscopy with Monochromation and In-Column Filter
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- / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 1186-1187
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- July 2011
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Novel Applications of Zeiss Libra 200 Cs-Corrected TEM with Energy Filtered Precession Electron Diffraction for Structure Determination of Nanocrystals
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- / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 26-27
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- July 2010
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Advantages of Monochromated Low Voltage Aberration Corrected TEM
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- / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 118-119
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- July 2010
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High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy)
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- / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1702-1703
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- July 2010
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Phase Contrast Aberration Corrected Electron Microscope for Phase Plate Imaging
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- / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 534-535
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- July 2010
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Aberration-Correction in a Monochromated and Energy Filtered Environment,
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- / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1490-1491
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- July 2009
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Cryo Imaging of Life Science and Soft Matter Samples by a State of the Art 120 kV EFTEM
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- / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 930-931
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- July 2009
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New developments in phase Contrast Transmission Electron Microscopy with Electrostatic Phase Plate
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- / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1086-1087
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- July 2009
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Pushing back the frontiers of CRYO in 120 kV TEMs
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- / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1326-1327
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- August 2008
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EFTEM with omega-type Monochromator – the most advanced analytical tool
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- / Volume 13 / Issue S03 / September 2007
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- 07 September 2007, pp. 64-65
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- September 2007
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Analytical Performance of the SESAM Microscope
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- / Volume 13 / Issue S03 / September 2007
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- 07 September 2007, pp. 18-19
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- September 2007
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Contrast Enhancement by Anamorphotic Phase Plates in an Aberration Corrected TEM
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- / Volume 13 / Issue S03 / September 2007
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- 07 September 2007, pp. 8-9
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- September 2007
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Contrast Transfer Function Design by an Electrostatic Phase Plate
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- / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1216-1217
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- August 2007
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